Quaternary Categorization Strategy for Reconstructing High-Reflectivity Surface in Structured Light Illumination
Structured light illumination is widely applied for surface defect detection due to its advantages in terms of speed, precision, and non-contact capabilities. However, the high reflectivity of metal surfaces often results in the loss of point clouds, thus reducing the measurement accuracy. In this p...
| Main Authors: | , , , , , , , |
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| Format: | Article |
| Language: | English |
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MDPI AG
2023-12-01
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| Series: | Sensors |
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| Online Access: | https://www.mdpi.com/1424-8220/23/24/9740 |
| _version_ | 1797379422403166208 |
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| author | Bin Xu Shangcheng Qu Jinhua Li Zhiyong Deng Hongyu Li Bo Zhang Geyou Zhang Kai Liu |
| author_facet | Bin Xu Shangcheng Qu Jinhua Li Zhiyong Deng Hongyu Li Bo Zhang Geyou Zhang Kai Liu |
| author_sort | Bin Xu |
| collection | DOAJ |
| description | Structured light illumination is widely applied for surface defect detection due to its advantages in terms of speed, precision, and non-contact capabilities. However, the high reflectivity of metal surfaces often results in the loss of point clouds, thus reducing the measurement accuracy. In this paper, we propose a novel quaternary categorization strategy to address the high-reflectivity issue. Firstly, we classify the pixels into four types according to the phase map characteristics. Secondly, we apply tailored optimization and reconstruction strategies to each type of pixel. Finally, we fuse point clouds from multi-type pixels to accomplish precise measurements of high-reflectivity surfaces. Experimental results show that our strategy effectively reduces the high-reflectivity error when measuring metal surfaces and exhibits stronger robustness against noise compared to the conventional method. |
| first_indexed | 2024-03-08T20:23:00Z |
| format | Article |
| id | doaj.art-5e9ed6f0fd934ceea1bf022a8b64b94a |
| institution | Directory Open Access Journal |
| issn | 1424-8220 |
| language | English |
| last_indexed | 2024-03-08T20:23:00Z |
| publishDate | 2023-12-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Sensors |
| spelling | doaj.art-5e9ed6f0fd934ceea1bf022a8b64b94a2023-12-22T14:40:28ZengMDPI AGSensors1424-82202023-12-012324974010.3390/s23249740Quaternary Categorization Strategy for Reconstructing High-Reflectivity Surface in Structured Light IlluminationBin Xu0Shangcheng Qu1Jinhua Li2Zhiyong Deng3Hongyu Li4Bo Zhang5Geyou Zhang6Kai Liu7School of Mechanical Engineering, Sichuan University, Chengdu 610065, ChinaSchool of Mechanical Engineering, Sichuan University, Chengdu 610065, ChinaSchool of Mechanical Engineering, Sichuan University, Chengdu 610065, ChinaNuclear Fuel and Material Institute, Nuclear Power Institute of China, Chengdu 610213, ChinaNuclear Fuel and Material Institute, Nuclear Power Institute of China, Chengdu 610213, ChinaSchool of Mechanical Engineering, Sichuan University, Chengdu 610065, ChinaSchool of Information and Communication Engineering, University of Electronic Science and Technology of China, Chengdu 611731, ChinaCollege of Electrical Engineering, Sichuan University, Chengdu 610065, ChinaStructured light illumination is widely applied for surface defect detection due to its advantages in terms of speed, precision, and non-contact capabilities. However, the high reflectivity of metal surfaces often results in the loss of point clouds, thus reducing the measurement accuracy. In this paper, we propose a novel quaternary categorization strategy to address the high-reflectivity issue. Firstly, we classify the pixels into four types according to the phase map characteristics. Secondly, we apply tailored optimization and reconstruction strategies to each type of pixel. Finally, we fuse point clouds from multi-type pixels to accomplish precise measurements of high-reflectivity surfaces. Experimental results show that our strategy effectively reduces the high-reflectivity error when measuring metal surfaces and exhibits stronger robustness against noise compared to the conventional method.https://www.mdpi.com/1424-8220/23/24/9740structured light illuminationhigh-reflectivity surfacedual projector3D measurement |
| spellingShingle | Bin Xu Shangcheng Qu Jinhua Li Zhiyong Deng Hongyu Li Bo Zhang Geyou Zhang Kai Liu Quaternary Categorization Strategy for Reconstructing High-Reflectivity Surface in Structured Light Illumination Sensors structured light illumination high-reflectivity surface dual projector 3D measurement |
| title | Quaternary Categorization Strategy for Reconstructing High-Reflectivity Surface in Structured Light Illumination |
| title_full | Quaternary Categorization Strategy for Reconstructing High-Reflectivity Surface in Structured Light Illumination |
| title_fullStr | Quaternary Categorization Strategy for Reconstructing High-Reflectivity Surface in Structured Light Illumination |
| title_full_unstemmed | Quaternary Categorization Strategy for Reconstructing High-Reflectivity Surface in Structured Light Illumination |
| title_short | Quaternary Categorization Strategy for Reconstructing High-Reflectivity Surface in Structured Light Illumination |
| title_sort | quaternary categorization strategy for reconstructing high reflectivity surface in structured light illumination |
| topic | structured light illumination high-reflectivity surface dual projector 3D measurement |
| url | https://www.mdpi.com/1424-8220/23/24/9740 |
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