Process Corresponding Implications Associated with a Conclusive Model-Fit Current-Voltage Characteristic Curves

Process Corresponding Implications Associated with a Conclusive Model-Fit Current-Voltage Characteristic Curves

NFinFET transistors with various fin widths (110 nm, 115 nm, and 120 nm) are put into measurements, and the data are collected. By using the modified model, the measure data is fitted. Several parameters in the formula of modified model are determined to make both the measured data and the fitting d...

पूर्ण विवरण

ग्रंथसूची विवरण
मुख्य लेखकों:	Hsin-Chia Yang, Sung-Ching Chi
स्वरूप:	लेख
भाषा:	English
प्रकाशित:	MDPI AG 2022-01-01
श्रृंखला:	Applied Sciences
विषय:	FinFET early voltage channel length and width
ऑनलाइन पहुंच:	https://www.mdpi.com/2076-3417/12/1/462

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