Duality characteristics of bipolar and unipolar resistive switching in a Pt/SrZrO3/TiOx/Pt stack

The mechanism of irreversible resistive switching (RS) conversion from bipolar to unipolar operation is investigated in a capacitor structure, SrZrO3/TiOx/Pt, prepared on a Pt/Ti/SiO2/Si substrate. Bipolar RS memory current–voltage characteristics are observed in the RS voltage window from +2.5 V to...

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Main Authors: Hyunsu Ju, Min Kyu Yang
Format: Article
Language:English
Published: AIP Publishing LLC 2020-06-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/5.0010045
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author Hyunsu Ju
Min Kyu Yang
author_facet Hyunsu Ju
Min Kyu Yang
author_sort Hyunsu Ju
collection DOAJ
description The mechanism of irreversible resistive switching (RS) conversion from bipolar to unipolar operation is investigated in a capacitor structure, SrZrO3/TiOx/Pt, prepared on a Pt/Ti/SiO2/Si substrate. Bipolar RS memory current–voltage characteristics are observed in the RS voltage window from +2.5 V to −1.9 V, which shows excellent durability and retention characteristics. As the voltage bias is increased to greater than +4 V, an additional forming process occurs, irreversibly converting the RS mode from the bipolar to the unipolar mode. In this study, two materials are combined with different switching mechanisms to enable the fabrication of RS memory with desirable characteristics in different current regions.
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spelling doaj.art-5ebdf3b82c6a4c89b477d0bade66d27e2022-12-21T19:19:29ZengAIP Publishing LLCAIP Advances2158-32262020-06-01106065221065221-510.1063/5.0010045Duality characteristics of bipolar and unipolar resistive switching in a Pt/SrZrO3/TiOx/Pt stackHyunsu Ju0Min Kyu Yang1Center for Opto-Electronic Materials and Devices, Korea Institute of Science and Technology, Seoul 02792, South KoreaDepartment of IT Convergence Engineering & Intelligent Electronic Device Lab, Sahmyook University, 815 Hwarang-ro, Nowon-Gu, Seoul 01795, South KoreaThe mechanism of irreversible resistive switching (RS) conversion from bipolar to unipolar operation is investigated in a capacitor structure, SrZrO3/TiOx/Pt, prepared on a Pt/Ti/SiO2/Si substrate. Bipolar RS memory current–voltage characteristics are observed in the RS voltage window from +2.5 V to −1.9 V, which shows excellent durability and retention characteristics. As the voltage bias is increased to greater than +4 V, an additional forming process occurs, irreversibly converting the RS mode from the bipolar to the unipolar mode. In this study, two materials are combined with different switching mechanisms to enable the fabrication of RS memory with desirable characteristics in different current regions.http://dx.doi.org/10.1063/5.0010045
spellingShingle Hyunsu Ju
Min Kyu Yang
Duality characteristics of bipolar and unipolar resistive switching in a Pt/SrZrO3/TiOx/Pt stack
AIP Advances
title Duality characteristics of bipolar and unipolar resistive switching in a Pt/SrZrO3/TiOx/Pt stack
title_full Duality characteristics of bipolar and unipolar resistive switching in a Pt/SrZrO3/TiOx/Pt stack
title_fullStr Duality characteristics of bipolar and unipolar resistive switching in a Pt/SrZrO3/TiOx/Pt stack
title_full_unstemmed Duality characteristics of bipolar and unipolar resistive switching in a Pt/SrZrO3/TiOx/Pt stack
title_short Duality characteristics of bipolar and unipolar resistive switching in a Pt/SrZrO3/TiOx/Pt stack
title_sort duality characteristics of bipolar and unipolar resistive switching in a pt srzro3 tiox pt stack
url http://dx.doi.org/10.1063/5.0010045
work_keys_str_mv AT hyunsuju dualitycharacteristicsofbipolarandunipolarresistiveswitchinginaptsrzro3tioxptstack
AT minkyuyang dualitycharacteristicsofbipolarandunipolarresistiveswitchinginaptsrzro3tioxptstack