| Summary: | We propose a novel approach to address the high-resolution problem for analyzing the peak position of an interference envelope in vertical-scanning wideband interferometry. Nonlinear envelope demodulation cannot be performed for arbitrary interference fringes because the envelope peak positions fluctuate depending on the acquisition statuses of the interference fringes. In the proposed method, first, the interference fringes are shifted until the desired results are obtained; this helps solve the discrepancy problem. Then, nonlinear envelope demodulation processing is applied to the selected shifted interference fringes. This paper describes the proposed procedure used in this study and its development using a shift selection scheme based on the envelope match characteristics of the shifted interference fringes. The proposed approach is introduced within the framework of super wideband light-based Michelson interferometry, and the experimental results demonstrate the superiority of the proposed algorithm over the conventional Fourier transform method for envelope peak resolution. The present technique is expected to be useful for the high-precision measurement of distances for not only scientific purposes but also industry requirements.
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