Electrical behavior of multi-walled carbon nanotube network embedded in amorphous silicon nitride
<p>Abstract</p> <p>The electrical behavior of multi-walled carbon nanotube network embedded in amorphous silicon nitride is studied by measuring the voltage and temperature dependences of the current. The microstructure of the network is investigated by cross-sectional transmission...
| Main Authors: | , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
SpringerOpen
2011-01-01
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| Series: | Nanoscale Research Letters |
| Online Access: | http://www.nanoscalereslett.com/content/6/1/88 |
| _version_ | 1797707393354694656 |
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| author | Buiculescu Raluca Iancu Vladimir Konstantinidis George Dragoman Mircea Stavarache Ionel Lepadatu Ana-Maria Teodorescu Valentin Ciurea Magdalena |
| author_facet | Buiculescu Raluca Iancu Vladimir Konstantinidis George Dragoman Mircea Stavarache Ionel Lepadatu Ana-Maria Teodorescu Valentin Ciurea Magdalena |
| author_sort | Buiculescu Raluca |
| collection | DOAJ |
| description | <p>Abstract</p> <p>The electrical behavior of multi-walled carbon nanotube network embedded in amorphous silicon nitride is studied by measuring the voltage and temperature dependences of the current. The microstructure of the network is investigated by cross-sectional transmission electron microscopy. The multi-walled carbon nanotube network has an uniform spatial extension in the silicon nitride matrix. The current-voltage and resistance-temperature characteristics are both linear, proving the metallic behavior of the network. The <it>I</it>-<it>V </it>curves present oscillations that are further analyzed by computing the conductance-voltage characteristics. The conductance presents minima and maxima that appear at the same voltage for both bias polarities, at both 20 and 298 K, and that are not periodic. These oscillations are interpreted as due to percolation processes. The voltage percolation thresholds are identified with the conductance minima.</p> |
| first_indexed | 2024-03-12T06:05:44Z |
| format | Article |
| id | doaj.art-5ef16acad6fb422c964478a91f9681a8 |
| institution | Directory Open Access Journal |
| issn | 1931-7573 1556-276X |
| language | English |
| last_indexed | 2024-03-12T06:05:44Z |
| publishDate | 2011-01-01 |
| publisher | SpringerOpen |
| record_format | Article |
| series | Nanoscale Research Letters |
| spelling | doaj.art-5ef16acad6fb422c964478a91f9681a82023-09-03T03:36:40ZengSpringerOpenNanoscale Research Letters1931-75731556-276X2011-01-016188Electrical behavior of multi-walled carbon nanotube network embedded in amorphous silicon nitrideBuiculescu RalucaIancu VladimirKonstantinidis GeorgeDragoman MirceaStavarache IonelLepadatu Ana-MariaTeodorescu ValentinCiurea Magdalena<p>Abstract</p> <p>The electrical behavior of multi-walled carbon nanotube network embedded in amorphous silicon nitride is studied by measuring the voltage and temperature dependences of the current. The microstructure of the network is investigated by cross-sectional transmission electron microscopy. The multi-walled carbon nanotube network has an uniform spatial extension in the silicon nitride matrix. The current-voltage and resistance-temperature characteristics are both linear, proving the metallic behavior of the network. The <it>I</it>-<it>V </it>curves present oscillations that are further analyzed by computing the conductance-voltage characteristics. The conductance presents minima and maxima that appear at the same voltage for both bias polarities, at both 20 and 298 K, and that are not periodic. These oscillations are interpreted as due to percolation processes. The voltage percolation thresholds are identified with the conductance minima.</p>http://www.nanoscalereslett.com/content/6/1/88 |
| spellingShingle | Buiculescu Raluca Iancu Vladimir Konstantinidis George Dragoman Mircea Stavarache Ionel Lepadatu Ana-Maria Teodorescu Valentin Ciurea Magdalena Electrical behavior of multi-walled carbon nanotube network embedded in amorphous silicon nitride Nanoscale Research Letters |
| title | Electrical behavior of multi-walled carbon nanotube network embedded in amorphous silicon nitride |
| title_full | Electrical behavior of multi-walled carbon nanotube network embedded in amorphous silicon nitride |
| title_fullStr | Electrical behavior of multi-walled carbon nanotube network embedded in amorphous silicon nitride |
| title_full_unstemmed | Electrical behavior of multi-walled carbon nanotube network embedded in amorphous silicon nitride |
| title_short | Electrical behavior of multi-walled carbon nanotube network embedded in amorphous silicon nitride |
| title_sort | electrical behavior of multi walled carbon nanotube network embedded in amorphous silicon nitride |
| url | http://www.nanoscalereslett.com/content/6/1/88 |
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