Low Cost Test Pattern Generation in Scan-Based BIST Schemes
This paper proposes a low-cost test pattern generator for scan-based built-in self-test (BIST) schemes. Our method generates broadcast-based multiple single input change (BMSIC) vectors to fill more scan chains. The proposed algorithm, BMSIC-TPG, is based on our previous work multiple single-input c...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
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MDPI AG
2019-03-01
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| Series: | Electronics |
| Subjects: | |
| Online Access: | http://www.mdpi.com/2079-9292/8/3/314 |
| _version_ | 1798005758097358848 |
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| author | Guohe Zhang Ye Yuan Feng Liang Sufen Wei Cheng-Fu Yang |
| author_facet | Guohe Zhang Ye Yuan Feng Liang Sufen Wei Cheng-Fu Yang |
| author_sort | Guohe Zhang |
| collection | DOAJ |
| description | This paper proposes a low-cost test pattern generator for scan-based built-in self-test (BIST) schemes. Our method generates broadcast-based multiple single input change (BMSIC) vectors to fill more scan chains. The proposed algorithm, BMSIC-TPG, is based on our previous work multiple single-input change (MSIC)-TPG. The broadcast circuit expends MSIC vectors, so that the hardware overhead of the test pattern generation circuit is reduced. Simulation results with ISCAS’89 benchmarks and a comparison with the MSIC-TPG circuit show that the proposed BMSIC-TPG reduces the circuit hardware overhead about 50% with ensuring of low power consumption and high fault coverage. |
| first_indexed | 2024-04-11T12:44:11Z |
| format | Article |
| id | doaj.art-5f270b599535481b9ce00ad11a092f6a |
| institution | Directory Open Access Journal |
| issn | 2079-9292 |
| language | English |
| last_indexed | 2024-04-11T12:44:11Z |
| publishDate | 2019-03-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Electronics |
| spelling | doaj.art-5f270b599535481b9ce00ad11a092f6a2022-12-22T04:23:24ZengMDPI AGElectronics2079-92922019-03-018331410.3390/electronics8030314electronics8030314Low Cost Test Pattern Generation in Scan-Based BIST SchemesGuohe Zhang0Ye Yuan1Feng Liang2Sufen Wei3Cheng-Fu Yang4School of Microelectronics, Xi’an Jiaotong University, Xi’an 710049, ChinaSchool of Microelectronics, Xi’an Jiaotong University, Xi’an 710049, ChinaSchool of Microelectronics, Xi’an Jiaotong University, Xi’an 710049, ChinaSchool of Microelectronics, Xi’an Jiaotong University, Xi’an 710049, ChinaDepartment of Chemical and Materials Engineering, National University of Kaohsiung, No. 700, Kaohsiung University Rd., Nan-Tzu District, Kaohsiung 811, TaiwanThis paper proposes a low-cost test pattern generator for scan-based built-in self-test (BIST) schemes. Our method generates broadcast-based multiple single input change (BMSIC) vectors to fill more scan chains. The proposed algorithm, BMSIC-TPG, is based on our previous work multiple single-input change (MSIC)-TPG. The broadcast circuit expends MSIC vectors, so that the hardware overhead of the test pattern generation circuit is reduced. Simulation results with ISCAS’89 benchmarks and a comparison with the MSIC-TPG circuit show that the proposed BMSIC-TPG reduces the circuit hardware overhead about 50% with ensuring of low power consumption and high fault coverage.http://www.mdpi.com/2079-9292/8/3/314test pattern generationbuilt-in self-testbroadcast circuitlow cost |
| spellingShingle | Guohe Zhang Ye Yuan Feng Liang Sufen Wei Cheng-Fu Yang Low Cost Test Pattern Generation in Scan-Based BIST Schemes Electronics test pattern generation built-in self-test broadcast circuit low cost |
| title | Low Cost Test Pattern Generation in Scan-Based BIST Schemes |
| title_full | Low Cost Test Pattern Generation in Scan-Based BIST Schemes |
| title_fullStr | Low Cost Test Pattern Generation in Scan-Based BIST Schemes |
| title_full_unstemmed | Low Cost Test Pattern Generation in Scan-Based BIST Schemes |
| title_short | Low Cost Test Pattern Generation in Scan-Based BIST Schemes |
| title_sort | low cost test pattern generation in scan based bist schemes |
| topic | test pattern generation built-in self-test broadcast circuit low cost |
| url | http://www.mdpi.com/2079-9292/8/3/314 |
| work_keys_str_mv | AT guohezhang lowcosttestpatterngenerationinscanbasedbistschemes AT yeyuan lowcosttestpatterngenerationinscanbasedbistschemes AT fengliang lowcosttestpatterngenerationinscanbasedbistschemes AT sufenwei lowcosttestpatterngenerationinscanbasedbistschemes AT chengfuyang lowcosttestpatterngenerationinscanbasedbistschemes |