Low Cost Test Pattern Generation in Scan-Based BIST Schemes

Low Cost Test Pattern Generation in Scan-Based BIST Schemes

This paper proposes a low-cost test pattern generator for scan-based built-in self-test (BIST) schemes. Our method generates broadcast-based multiple single input change (BMSIC) vectors to fill more scan chains. The proposed algorithm, BMSIC-TPG, is based on our previous work multiple single-input c...

Full description

Bibliographic Details
Main Authors: Guohe Zhang, Ye Yuan, Feng Liang, Sufen Wei, Cheng-Fu Yang
Format: Article
Language:English
Published: MDPI AG 2019-03-01
Series:Electronics
Subjects:
test pattern generation
built-in self-test
broadcast circuit
low cost
Online Access:http://www.mdpi.com/2079-9292/8/3/314

Similar Items

Similar Items