Granular Hall Sensors for Scanning Probe Microscopy
Scanning Hall probe microscopy is attractive for minimally invasive characterization of magnetic thin films and nanostructures by measurement of the emanating magnetic stray field. Established sensor probes operating at room temperature employ highly miniaturized spin-valve elements or semimetals, s...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
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MDPI AG
2021-02-01
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| Series: | Nanomaterials |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2079-4991/11/2/348 |
| _version_ | 1797417215327207424 |
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| author | Roland Sachser Johanna Hütner Christian H. Schwalb Michael Huth |
| author_facet | Roland Sachser Johanna Hütner Christian H. Schwalb Michael Huth |
| author_sort | Roland Sachser |
| collection | DOAJ |
| description | Scanning Hall probe microscopy is attractive for minimally invasive characterization of magnetic thin films and nanostructures by measurement of the emanating magnetic stray field. Established sensor probes operating at room temperature employ highly miniaturized spin-valve elements or semimetals, such as Bi. As the sensor layer structures are fabricated by patterning of planar thin films, their adaption to custom-made sensor probe geometries is highly challenging or impossible. Here we show how nanogranular ferromagnetic Hall devices fabricated by the direct-write method of focused electron beam induced deposition (FEBID) can be tailor-made for any given probe geometry. Furthermore, we demonstrate how the magnetic stray field sensitivity can be optimized in situ directly after direct-write nanofabrication of the sensor element. First proof-of-principle results on the use of this novel scanning Hall sensor are shown. |
| first_indexed | 2024-03-09T06:15:35Z |
| format | Article |
| id | doaj.art-5f685ee696434acfa184055192bbf286 |
| institution | Directory Open Access Journal |
| issn | 2079-4991 |
| language | English |
| last_indexed | 2024-03-09T06:15:35Z |
| publishDate | 2021-02-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Nanomaterials |
| spelling | doaj.art-5f685ee696434acfa184055192bbf2862023-12-03T11:52:57ZengMDPI AGNanomaterials2079-49912021-02-0111234810.3390/nano11020348Granular Hall Sensors for Scanning Probe MicroscopyRoland Sachser0Johanna Hütner1Christian H. Schwalb2Michael Huth3Institute of Physics, Goethe University, Max-von-Laue-Str. 1, 60438 Frankfurt am Main, GermanyGETec Microscopy GmbH, Am Heumarkt 13, 1030 Wien, AustriaQuantum Design Microscopy, Im Tiefen See. 60a, 64293 Darmstadt, GermanyInstitute of Physics, Goethe University, Max-von-Laue-Str. 1, 60438 Frankfurt am Main, GermanyScanning Hall probe microscopy is attractive for minimally invasive characterization of magnetic thin films and nanostructures by measurement of the emanating magnetic stray field. Established sensor probes operating at room temperature employ highly miniaturized spin-valve elements or semimetals, such as Bi. As the sensor layer structures are fabricated by patterning of planar thin films, their adaption to custom-made sensor probe geometries is highly challenging or impossible. Here we show how nanogranular ferromagnetic Hall devices fabricated by the direct-write method of focused electron beam induced deposition (FEBID) can be tailor-made for any given probe geometry. Furthermore, we demonstrate how the magnetic stray field sensitivity can be optimized in situ directly after direct-write nanofabrication of the sensor element. First proof-of-principle results on the use of this novel scanning Hall sensor are shown.https://www.mdpi.com/2079-4991/11/2/348focused electron beam induced depositiongranular ferromagnetsscanning Hall probe microscopy |
| spellingShingle | Roland Sachser Johanna Hütner Christian H. Schwalb Michael Huth Granular Hall Sensors for Scanning Probe Microscopy Nanomaterials focused electron beam induced deposition granular ferromagnets scanning Hall probe microscopy |
| title | Granular Hall Sensors for Scanning Probe Microscopy |
| title_full | Granular Hall Sensors for Scanning Probe Microscopy |
| title_fullStr | Granular Hall Sensors for Scanning Probe Microscopy |
| title_full_unstemmed | Granular Hall Sensors for Scanning Probe Microscopy |
| title_short | Granular Hall Sensors for Scanning Probe Microscopy |
| title_sort | granular hall sensors for scanning probe microscopy |
| topic | focused electron beam induced deposition granular ferromagnets scanning Hall probe microscopy |
| url | https://www.mdpi.com/2079-4991/11/2/348 |
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