| Summary: | The application of the improved dynamic polarimetric method for the measurement of the quadratic electro-optic effect in NH<sub>4</sub>H<sub>2</sub>PO<sub>4</sub> (ADP) crystal with the light beam propagating perpendicularly to its optical axis is presented. This technique can be applied in noncetrosymmetric crystals in the presence of natural birefringence even when the fast and slow rays diverge slightly, causing them to only partially interfere. The method allows for minor errors in cutting and orientation of the crystal samples, resulting in deviations from configurations in which the crystal symmetry vetoes the linear electro-optic effect. The occurring contribution of the linear effect, if it is not too large, not only does not exclude the measurement of the quadratic effect, but increases its accuracy. The method does not require any prior compensation for the natural birefringence. Its sensitivity allows for quadratic electro-optic effect measurements in ferroelectrics in temperatures significantly different from the phase transition temperature or in paraelectric crystals, for which this effect is relatively small.
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