Unbalanced-Tests to the Improvement of Yield and Quality
An integrated-circuit testing model (DITM) is used to describe various factors that affect test yield during a test process. We used a probability distribution model to evaluate test yield and quality and introduced a threshold test and a guardband test. As a result of the development speed of the s...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
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MDPI AG
2021-12-01
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| Series: | Electronics |
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| Online Access: | https://www.mdpi.com/2079-9292/10/23/3032 |
| _version_ | 1797507914895720448 |
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| author | Chung-Huang Yeh Jwu-E Chen |
| author_facet | Chung-Huang Yeh Jwu-E Chen |
| author_sort | Chung-Huang Yeh |
| collection | DOAJ |
| description | An integrated-circuit testing model (DITM) is used to describe various factors that affect test yield during a test process. We used a probability distribution model to evaluate test yield and quality and introduced a threshold test and a guardband test. As a result of the development speed of the semiconductor manufacturing industry in the future being unpredictable, we use electrical properties of existing products and the current manufacturing technology to estimate future product-distribution trends. In the development of very-large-scale integration (VLSI) testing, the progress of testing technology is very slow. To improve product testing yield and quality, we change the test method and propose an unbalanced-test method, leading to improvements in test results. The calculation using our proposed model and data estimated by the product published by the IEEE International Roadmap for Devices and Systems (IRDS, 2017) proves that the proposed unbalanced-test method can greatly improve test yield and quality and achieve the goal of high-quality, near-zero-defect products. |
| first_indexed | 2024-03-10T04:55:13Z |
| format | Article |
| id | doaj.art-6035ad7aeb154326bedc1c3b1139e423 |
| institution | Directory Open Access Journal |
| issn | 2079-9292 |
| language | English |
| last_indexed | 2024-03-10T04:55:13Z |
| publishDate | 2021-12-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Electronics |
| spelling | doaj.art-6035ad7aeb154326bedc1c3b1139e4232023-11-23T02:18:02ZengMDPI AGElectronics2079-92922021-12-011023303210.3390/electronics10233032Unbalanced-Tests to the Improvement of Yield and QualityChung-Huang Yeh0Jwu-E Chen1Department of Electrical Engineering, National Central University, Taoyuan 320317, TaiwanDepartment of Electrical Engineering, National Central University, Taoyuan 320317, TaiwanAn integrated-circuit testing model (DITM) is used to describe various factors that affect test yield during a test process. We used a probability distribution model to evaluate test yield and quality and introduced a threshold test and a guardband test. As a result of the development speed of the semiconductor manufacturing industry in the future being unpredictable, we use electrical properties of existing products and the current manufacturing technology to estimate future product-distribution trends. In the development of very-large-scale integration (VLSI) testing, the progress of testing technology is very slow. To improve product testing yield and quality, we change the test method and propose an unbalanced-test method, leading to improvements in test results. The calculation using our proposed model and data estimated by the product published by the IEEE International Roadmap for Devices and Systems (IRDS, 2017) proves that the proposed unbalanced-test method can greatly improve test yield and quality and achieve the goal of high-quality, near-zero-defect products.https://www.mdpi.com/2079-9292/10/23/3032manufacturing yieldtest qualitythreshold testdefect level |
| spellingShingle | Chung-Huang Yeh Jwu-E Chen Unbalanced-Tests to the Improvement of Yield and Quality Electronics manufacturing yield test quality threshold test defect level |
| title | Unbalanced-Tests to the Improvement of Yield and Quality |
| title_full | Unbalanced-Tests to the Improvement of Yield and Quality |
| title_fullStr | Unbalanced-Tests to the Improvement of Yield and Quality |
| title_full_unstemmed | Unbalanced-Tests to the Improvement of Yield and Quality |
| title_short | Unbalanced-Tests to the Improvement of Yield and Quality |
| title_sort | unbalanced tests to the improvement of yield and quality |
| topic | manufacturing yield test quality threshold test defect level |
| url | https://www.mdpi.com/2079-9292/10/23/3032 |
| work_keys_str_mv | AT chunghuangyeh unbalancedteststotheimprovementofyieldandquality AT jwuechen unbalancedteststotheimprovementofyieldandquality |