Author Correction: Highly accurate determination of heterogeneously stacked Van-der-Waals materials by optical microspectroscopy
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Nature Portfolio
2023-01-01
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| Series: | Scientific Reports |
| Online Access: | https://doi.org/10.1038/s41598-023-28605-0 |
| _version_ | 1811175813415960576 |
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| author | Andreas Hutzler Birk Fritsch Christian D. Matthus Michael P. M. Jank Mathias Rommel |
| author_facet | Andreas Hutzler Birk Fritsch Christian D. Matthus Michael P. M. Jank Mathias Rommel |
| author_sort | Andreas Hutzler |
| collection | DOAJ |
| first_indexed | 2024-04-10T19:43:03Z |
| format | Article |
| id | doaj.art-60fd371bf1904ca9b95f7ed2f2e13230 |
| institution | Directory Open Access Journal |
| issn | 2045-2322 |
| language | English |
| last_indexed | 2024-04-10T19:43:03Z |
| publishDate | 2023-01-01 |
| publisher | Nature Portfolio |
| record_format | Article |
| series | Scientific Reports |
| spelling | doaj.art-60fd371bf1904ca9b95f7ed2f2e132302023-01-29T12:12:49ZengNature PortfolioScientific Reports2045-23222023-01-011311110.1038/s41598-023-28605-0Author Correction: Highly accurate determination of heterogeneously stacked Van-der-Waals materials by optical microspectroscopyAndreas Hutzler0Birk Fritsch1Christian D. Matthus2Michael P. M. Jank3Mathias Rommel4Electron Devices (LEB), Friedrich-Alexander University Erlangen-NürnbergElectron Devices (LEB), Friedrich-Alexander University Erlangen-NürnbergCircuit Design and Network Theory, Technische Universität DresdenFraunhofer Institute for Integrated Systems and Device Technology IISBFraunhofer Institute for Integrated Systems and Device Technology IISBhttps://doi.org/10.1038/s41598-023-28605-0 |
| spellingShingle | Andreas Hutzler Birk Fritsch Christian D. Matthus Michael P. M. Jank Mathias Rommel Author Correction: Highly accurate determination of heterogeneously stacked Van-der-Waals materials by optical microspectroscopy Scientific Reports |
| title | Author Correction: Highly accurate determination of heterogeneously stacked Van-der-Waals materials by optical microspectroscopy |
| title_full | Author Correction: Highly accurate determination of heterogeneously stacked Van-der-Waals materials by optical microspectroscopy |
| title_fullStr | Author Correction: Highly accurate determination of heterogeneously stacked Van-der-Waals materials by optical microspectroscopy |
| title_full_unstemmed | Author Correction: Highly accurate determination of heterogeneously stacked Van-der-Waals materials by optical microspectroscopy |
| title_short | Author Correction: Highly accurate determination of heterogeneously stacked Van-der-Waals materials by optical microspectroscopy |
| title_sort | author correction highly accurate determination of heterogeneously stacked van der waals materials by optical microspectroscopy |
| url | https://doi.org/10.1038/s41598-023-28605-0 |
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