Control theory for scanning probe microscopy revisited
We derive a theoretical model for studying SPM feedback in the context of control theory. Previous models presented in the literature that apply standard models for proportional-integral-derivative controllers predict a highly unstable feedback environment. This model uses features specific to the S...
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| Format: | Article |
| Language: | English |
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Beilstein-Institut
2014-03-01
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| Series: | Beilstein Journal of Nanotechnology |
| Subjects: | |
| Online Access: | https://doi.org/10.3762/bjnano.5.38 |
| _version_ | 1818274764767100928 |
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| author | Julian Stirling |
| author_facet | Julian Stirling |
| author_sort | Julian Stirling |
| collection | DOAJ |
| description | We derive a theoretical model for studying SPM feedback in the context of control theory. Previous models presented in the literature that apply standard models for proportional-integral-derivative controllers predict a highly unstable feedback environment. This model uses features specific to the SPM implementation of the proportional-integral controller to give realistic feedback behaviour. As such the stability of SPM feedback for a wide range of feedback gains can be understood. Further consideration of mechanical responses of the SPM system gives insight into the causes of exciting mechanical resonances of the scanner during feedback operation. |
| first_indexed | 2024-12-12T22:19:03Z |
| format | Article |
| id | doaj.art-62eed290aa4043c8b6fd7339507f14ac |
| institution | Directory Open Access Journal |
| issn | 2190-4286 |
| language | English |
| last_indexed | 2024-12-12T22:19:03Z |
| publishDate | 2014-03-01 |
| publisher | Beilstein-Institut |
| record_format | Article |
| series | Beilstein Journal of Nanotechnology |
| spelling | doaj.art-62eed290aa4043c8b6fd7339507f14ac2022-12-22T00:09:59ZengBeilstein-InstitutBeilstein Journal of Nanotechnology2190-42862014-03-015133734510.3762/bjnano.5.382190-4286-5-38Control theory for scanning probe microscopy revisitedJulian Stirling0School of Physics and Astronomy, The University of Nottingham, University Park, Nottingham, NG7 2RD, United KingdomWe derive a theoretical model for studying SPM feedback in the context of control theory. Previous models presented in the literature that apply standard models for proportional-integral-derivative controllers predict a highly unstable feedback environment. This model uses features specific to the SPM implementation of the proportional-integral controller to give realistic feedback behaviour. As such the stability of SPM feedback for a wide range of feedback gains can be understood. Further consideration of mechanical responses of the SPM system gives insight into the causes of exciting mechanical resonances of the scanner during feedback operation.https://doi.org/10.3762/bjnano.5.38AFMcontrol theoryfeedbackscanning probe microscopy |
| spellingShingle | Julian Stirling Control theory for scanning probe microscopy revisited Beilstein Journal of Nanotechnology AFM control theory feedback scanning probe microscopy |
| title | Control theory for scanning probe microscopy revisited |
| title_full | Control theory for scanning probe microscopy revisited |
| title_fullStr | Control theory for scanning probe microscopy revisited |
| title_full_unstemmed | Control theory for scanning probe microscopy revisited |
| title_short | Control theory for scanning probe microscopy revisited |
| title_sort | control theory for scanning probe microscopy revisited |
| topic | AFM control theory feedback scanning probe microscopy |
| url | https://doi.org/10.3762/bjnano.5.38 |
| work_keys_str_mv | AT julianstirling controltheoryforscanningprobemicroscopyrevisited |