Estimation during Design Phases of Suitable SRAM Cells for PUF Applications Using Separatrix and Mismatch Metrics
Physically unclonable functions (PUFs) are used as low-cost cryptographic primitives in device authentication and secret key creation. SRAM-PUFs are well-known as entropy sources; nevertheless, due of non-deterministic noise environment during the power-up process, they are subject to low challenge-...
| Main Authors: | , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2021-06-01
|
| Series: | Electronics |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2079-9292/10/12/1479 |
| _version_ | 1797529559564812288 |
|---|---|
| author | Abdel Alheyasat Gabriel Torrens Sebastià A. Bota Bartomeu Alorda |
| author_facet | Abdel Alheyasat Gabriel Torrens Sebastià A. Bota Bartomeu Alorda |
| author_sort | Abdel Alheyasat |
| collection | DOAJ |
| description | Physically unclonable functions (PUFs) are used as low-cost cryptographic primitives in device authentication and secret key creation. SRAM-PUFs are well-known as entropy sources; nevertheless, due of non-deterministic noise environment during the power-up process, they are subject to low challenge-response repeatability. The dependability of SRAM-PUFs is usually accomplished by combining complex error correcting codes (ECCs) with fuzzy extractor structures resulting in an increase in power consumption, area, cost, and design complexity. In this study, we established effective metrics on the basis of the separatrix concept and cell mismatch to estimate the percentage of cells that, due to the effect of variability, will tend to the same initial state during power-up. The effects of noise and temperature in cell start-up processes were used to validate the proposed metrics. The presented metrics may be applied at the SRAM-PUF design phases to investigate the impact of different design parameters on the percentage of reliable cells for PUF applications. |
| first_indexed | 2024-03-10T10:15:35Z |
| format | Article |
| id | doaj.art-631caa2705db483188b41786278dd574 |
| institution | Directory Open Access Journal |
| issn | 2079-9292 |
| language | English |
| last_indexed | 2024-03-10T10:15:35Z |
| publishDate | 2021-06-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Electronics |
| spelling | doaj.art-631caa2705db483188b41786278dd5742023-11-22T00:51:08ZengMDPI AGElectronics2079-92922021-06-011012147910.3390/electronics10121479Estimation during Design Phases of Suitable SRAM Cells for PUF Applications Using Separatrix and Mismatch MetricsAbdel Alheyasat0Gabriel Torrens1Sebastià A. Bota2Bartomeu Alorda3Industrial and Construction Engineering Department, University of the Balearic Islands, 07120 Palma, SpainIndustrial and Construction Engineering Department, University of the Balearic Islands, 07120 Palma, SpainIndustrial and Construction Engineering Department, University of the Balearic Islands, 07120 Palma, SpainIndustrial and Construction Engineering Department, University of the Balearic Islands, 07120 Palma, SpainPhysically unclonable functions (PUFs) are used as low-cost cryptographic primitives in device authentication and secret key creation. SRAM-PUFs are well-known as entropy sources; nevertheless, due of non-deterministic noise environment during the power-up process, they are subject to low challenge-response repeatability. The dependability of SRAM-PUFs is usually accomplished by combining complex error correcting codes (ECCs) with fuzzy extractor structures resulting in an increase in power consumption, area, cost, and design complexity. In this study, we established effective metrics on the basis of the separatrix concept and cell mismatch to estimate the percentage of cells that, due to the effect of variability, will tend to the same initial state during power-up. The effects of noise and temperature in cell start-up processes were used to validate the proposed metrics. The presented metrics may be applied at the SRAM-PUF design phases to investigate the impact of different design parameters on the percentage of reliable cells for PUF applications.https://www.mdpi.com/2079-9292/10/12/1479SRAM cell characterizationreliability marginsmismatch metricsSRAM-PUFs |
| spellingShingle | Abdel Alheyasat Gabriel Torrens Sebastià A. Bota Bartomeu Alorda Estimation during Design Phases of Suitable SRAM Cells for PUF Applications Using Separatrix and Mismatch Metrics Electronics SRAM cell characterization reliability margins mismatch metrics SRAM-PUFs |
| title | Estimation during Design Phases of Suitable SRAM Cells for PUF Applications Using Separatrix and Mismatch Metrics |
| title_full | Estimation during Design Phases of Suitable SRAM Cells for PUF Applications Using Separatrix and Mismatch Metrics |
| title_fullStr | Estimation during Design Phases of Suitable SRAM Cells for PUF Applications Using Separatrix and Mismatch Metrics |
| title_full_unstemmed | Estimation during Design Phases of Suitable SRAM Cells for PUF Applications Using Separatrix and Mismatch Metrics |
| title_short | Estimation during Design Phases of Suitable SRAM Cells for PUF Applications Using Separatrix and Mismatch Metrics |
| title_sort | estimation during design phases of suitable sram cells for puf applications using separatrix and mismatch metrics |
| topic | SRAM cell characterization reliability margins mismatch metrics SRAM-PUFs |
| url | https://www.mdpi.com/2079-9292/10/12/1479 |
| work_keys_str_mv | AT abdelalheyasat estimationduringdesignphasesofsuitablesramcellsforpufapplicationsusingseparatrixandmismatchmetrics AT gabrieltorrens estimationduringdesignphasesofsuitablesramcellsforpufapplicationsusingseparatrixandmismatchmetrics AT sebastiaabota estimationduringdesignphasesofsuitablesramcellsforpufapplicationsusingseparatrixandmismatchmetrics AT bartomeualorda estimationduringdesignphasesofsuitablesramcellsforpufapplicationsusingseparatrixandmismatchmetrics |