Fault Coverage Improvement of CMOS Analog Circuits Using Supply Current Testing Method
In this paper, a testing technique based on supply current verifying is presented, for fault detection of analog circuits containing CMOS operational amplifiers. This testing technique is employed and developed to maximize the fault coverage of the circuit under test (CUT) using transient a...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
University of Banja Luka
2023-06-01
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| Series: | Electronics |
| Online Access: | https://els-journal.net/wp/?page_id=679 |