Direct structure analysis of advanced nanomaterials by high-resolution electron microscopy
High-resolution electron microscopy (HREM) analysis has contributed to the direct structure analysis of advanced nanostructured materials, of which the properties of these materials are strongly dependent on the atomic arrangements. In the present article, the direct structure analysis of nanostruct...
| Main Author: | |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
De Gruyter
2012-10-01
|
| Series: | Nanotechnology Reviews |
| Subjects: | |
| Online Access: | https://doi.org/10.1515/ntrev-2012-0018 |