Under-FET Thermal Sensor Enabling Smart Full-Chip Run-Time Thermal Management
This article reports design, fabrication and analysis of a novel under-transistor (under-FET) in-hole thermal sensor diode structure. Being able to accurately monitor self-heating of individual transistor in-operando, the under-FET temperature sensor enables smart full-chip run-time thermal manageme...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2020-01-01
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| Series: | IEEE Journal of the Electron Devices Society |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9187944/ |
| _version_ | 1818822927967059968 |
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| author | Cheng Li Qi Chen Feilong Zhang Mengfu Di Zijin Pan Fei Lu Albert Wang |
| author_facet | Cheng Li Qi Chen Feilong Zhang Mengfu Di Zijin Pan Fei Lu Albert Wang |
| author_sort | Cheng Li |
| collection | DOAJ |
| description | This article reports design, fabrication and analysis of a novel under-transistor (under-FET) in-hole thermal sensor diode structure. Being able to accurately monitor self-heating of individual transistor in-operando, the under-FET temperature sensor enables smart full-chip run-time thermal management with spatial resolution down to single transistor level. The in-hole thermal sensors were fabricated in a CMOS process and validated in measurements. The new chip level thermal management technique was demonstrated using a prototype power amplifier (PA) IC designed in a foundry 40nm CMOS. It opens a door for self-learning based full-chip real-time intelligent thermal management for future ICs. |
| first_indexed | 2024-12-18T23:31:52Z |
| format | Article |
| id | doaj.art-63ecbbc27e664ef08261d3efa734b889 |
| institution | Directory Open Access Journal |
| issn | 2168-6734 |
| language | English |
| last_indexed | 2024-12-18T23:31:52Z |
| publishDate | 2020-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Journal of the Electron Devices Society |
| spelling | doaj.art-63ecbbc27e664ef08261d3efa734b8892022-12-21T20:47:39ZengIEEEIEEE Journal of the Electron Devices Society2168-67342020-01-0181242124810.1109/JEDS.2020.30227309187944Under-FET Thermal Sensor Enabling Smart Full-Chip Run-Time Thermal ManagementCheng Li0https://orcid.org/0000-0001-9300-7583Qi Chen1https://orcid.org/0000-0003-4820-6430Feilong Zhang2https://orcid.org/0000-0002-7014-9447Mengfu Di3https://orcid.org/0000-0001-7629-5827Zijin Pan4https://orcid.org/0000-0001-5837-2446Fei Lu5https://orcid.org/0000-0002-4928-2171Albert Wang6https://orcid.org/0000-0002-0581-5765Department of Electrical and Computer Engineering, University of California, Riverside, CA, USADepartment of Electrical and Computer Engineering, University of California, Riverside, CA, USADepartment of Electrical and Computer Engineering, University of California, Riverside, CA, USADepartment of Electrical and Computer Engineering, University of California, Riverside, CA, USADepartment of Electrical and Computer Engineering, University of California, Riverside, CA, USADepartment of Electrical and Computer Engineering, University of California, Riverside, CA, USADepartment of Electrical and Computer Engineering, University of California, Riverside, CA, USAThis article reports design, fabrication and analysis of a novel under-transistor (under-FET) in-hole thermal sensor diode structure. Being able to accurately monitor self-heating of individual transistor in-operando, the under-FET temperature sensor enables smart full-chip run-time thermal management with spatial resolution down to single transistor level. The in-hole thermal sensors were fabricated in a CMOS process and validated in measurements. The new chip level thermal management technique was demonstrated using a prototype power amplifier (PA) IC designed in a foundry 40nm CMOS. It opens a door for self-learning based full-chip real-time intelligent thermal management for future ICs.https://ieeexplore.ieee.org/document/9187944/Self-heatingthermal sensorin-hole diodethermal mappingthermal managementcontrol circuit |
| spellingShingle | Cheng Li Qi Chen Feilong Zhang Mengfu Di Zijin Pan Fei Lu Albert Wang Under-FET Thermal Sensor Enabling Smart Full-Chip Run-Time Thermal Management IEEE Journal of the Electron Devices Society Self-heating thermal sensor in-hole diode thermal mapping thermal management control circuit |
| title | Under-FET Thermal Sensor Enabling Smart Full-Chip Run-Time Thermal Management |
| title_full | Under-FET Thermal Sensor Enabling Smart Full-Chip Run-Time Thermal Management |
| title_fullStr | Under-FET Thermal Sensor Enabling Smart Full-Chip Run-Time Thermal Management |
| title_full_unstemmed | Under-FET Thermal Sensor Enabling Smart Full-Chip Run-Time Thermal Management |
| title_short | Under-FET Thermal Sensor Enabling Smart Full-Chip Run-Time Thermal Management |
| title_sort | under fet thermal sensor enabling smart full chip run time thermal management |
| topic | Self-heating thermal sensor in-hole diode thermal mapping thermal management control circuit |
| url | https://ieeexplore.ieee.org/document/9187944/ |
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