Under-FET Thermal Sensor Enabling Smart Full-Chip Run-Time Thermal Management

Under-FET Thermal Sensor Enabling Smart Full-Chip Run-Time Thermal Management

This article reports design, fabrication and analysis of a novel under-transistor (under-FET) in-hole thermal sensor diode structure. Being able to accurately monitor self-heating of individual transistor in-operando, the under-FET temperature sensor enables smart full-chip run-time thermal manageme...

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Bibliographic Details
Main Authors: Cheng Li, Qi Chen, Feilong Zhang, Mengfu Di, Zijin Pan, Fei Lu, Albert Wang
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Journal of the Electron Devices Society
Subjects:
Self-heating
thermal sensor
in-hole diode
thermal mapping
thermal management
control circuit
Online Access:https://ieeexplore.ieee.org/document/9187944/

Internet

https://ieeexplore.ieee.org/document/9187944/

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