Amplitude modulation atomic force microscopy based on higher flexural modes
In this work, amplitude modulation atomic force microscopy (AM-AFM) based on the higher flexural modes of the microcantilever is investigated by a numerical approach. The amplitude-distance and phase-distance curves for the first four flexural modes are obtained and compared. The dependence of phase...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2017-12-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.5004732 |
| Summary: | In this work, amplitude modulation atomic force microscopy (AM-AFM) based on the higher flexural modes of the microcantilever is investigated by a numerical approach. The amplitude-distance and phase-distance curves for the first four flexural modes are obtained and compared. The dependence of phase on elastic modulus and viscosity of the sample is analyzed. Results show that a higher flexural mode yields a larger amplitude and phase in the repulsive regime and reduces the bistability, but causes a larger sample deformation and peak repulsive force. Compared to that of a lower flexural mode, the phase of a higher flexural mode provides higher sensitivity to viscosity variation for relatively large moduli. |
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| ISSN: | 2158-3226 |