Assessment of Nit-Occlud atrial septal defect occluder device healing process using micro-computed tomography imaging

Assessment of Nit-Occlud atrial septal defect occluder device healing process using micro-computed tomography imaging

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After percutaneous implantation of a cardiac occluder, a complex healing process leads to the device coverage within several months. An incomplete device coverage increases the risk of device related complications such as thrombosis or endocarditis. We aimed to assess the device coverage process of...

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Bibliographic Details
Main Authors: Elodie Perdreau, Zakaria Jalal, Richard D. Walton, Matthias Sigler, Hubert Cochet, Jérôme Naulin, Bruno Quesson, Olivier Bernus, Jean-Benoît Thambo
Format: Article
Language:English
Published: Public Library of Science (PLoS) 2023-01-01
Series:PLoS ONE
Online Access:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10124873/?tool=EBI

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