Influence of thermal agitation on the electric field induced precessional magnetization reversal with perpendicular easy axis
We investigated the influence of thermal agitation on the electric field induced precessional magnetization switching probability with perpendicular easy axis by solving the Fokker-Planck equation numerically with finite difference method. The calculated results show that the thermal agitation durin...
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Format: | Article |
Language: | English |
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AIP Publishing LLC
2013-12-01
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Series: | AIP Advances |
Online Access: | http://dx.doi.org/10.1063/1.4858423 |
_version_ | 1819140603803336704 |
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author | Hongguang Cheng Ning Deng |
author_facet | Hongguang Cheng Ning Deng |
author_sort | Hongguang Cheng |
collection | DOAJ |
description | We investigated the influence of thermal agitation on the electric field induced precessional magnetization switching probability with perpendicular easy axis by solving the Fokker-Planck equation numerically with finite difference method. The calculated results show that the thermal agitation during the reversal process crucially influences the switching probability. The switching probability can be achieved is only determined by the thermal stability factor Δ of the free layer, it is independent on the device dimension, which is important for the high density device application. Ultra-low error rate down to the order of 10−9 can be achieved for the device of thermal stability factor Δ of 40. Low damping factor α material should be used for the free layer for high reliability device applications. These results exhibit potential of electric field induced precessional magnetization switching with perpendicular easy axis for ultra-low power, high speed and high density magnetic random access memory (MRAM) applications. |
first_indexed | 2024-12-22T11:41:11Z |
format | Article |
id | doaj.art-649b456dc593498596c169a06bd64419 |
institution | Directory Open Access Journal |
issn | 2158-3226 |
language | English |
last_indexed | 2024-12-22T11:41:11Z |
publishDate | 2013-12-01 |
publisher | AIP Publishing LLC |
record_format | Article |
series | AIP Advances |
spelling | doaj.art-649b456dc593498596c169a06bd644192022-12-21T18:27:17ZengAIP Publishing LLCAIP Advances2158-32262013-12-01312122124122124-610.1063/1.4858423018312ADVInfluence of thermal agitation on the electric field induced precessional magnetization reversal with perpendicular easy axisHongguang Cheng0Ning Deng1Institute of Microelectronics, Tsinghua University, Beijing 100084, P. R. ChinaInstitute of Microelectronics, Tsinghua University, Beijing 100084, P. R. ChinaWe investigated the influence of thermal agitation on the electric field induced precessional magnetization switching probability with perpendicular easy axis by solving the Fokker-Planck equation numerically with finite difference method. The calculated results show that the thermal agitation during the reversal process crucially influences the switching probability. The switching probability can be achieved is only determined by the thermal stability factor Δ of the free layer, it is independent on the device dimension, which is important for the high density device application. Ultra-low error rate down to the order of 10−9 can be achieved for the device of thermal stability factor Δ of 40. Low damping factor α material should be used for the free layer for high reliability device applications. These results exhibit potential of electric field induced precessional magnetization switching with perpendicular easy axis for ultra-low power, high speed and high density magnetic random access memory (MRAM) applications.http://dx.doi.org/10.1063/1.4858423 |
spellingShingle | Hongguang Cheng Ning Deng Influence of thermal agitation on the electric field induced precessional magnetization reversal with perpendicular easy axis AIP Advances |
title | Influence of thermal agitation on the electric field induced precessional magnetization reversal with perpendicular easy axis |
title_full | Influence of thermal agitation on the electric field induced precessional magnetization reversal with perpendicular easy axis |
title_fullStr | Influence of thermal agitation on the electric field induced precessional magnetization reversal with perpendicular easy axis |
title_full_unstemmed | Influence of thermal agitation on the electric field induced precessional magnetization reversal with perpendicular easy axis |
title_short | Influence of thermal agitation on the electric field induced precessional magnetization reversal with perpendicular easy axis |
title_sort | influence of thermal agitation on the electric field induced precessional magnetization reversal with perpendicular easy axis |
url | http://dx.doi.org/10.1063/1.4858423 |
work_keys_str_mv | AT hongguangcheng influenceofthermalagitationontheelectricfieldinducedprecessionalmagnetizationreversalwithperpendiculareasyaxis AT ningdeng influenceofthermalagitationontheelectricfieldinducedprecessionalmagnetizationreversalwithperpendiculareasyaxis |