Influence of thermal agitation on the electric field induced precessional magnetization reversal with perpendicular easy axis

We investigated the influence of thermal agitation on the electric field induced precessional magnetization switching probability with perpendicular easy axis by solving the Fokker-Planck equation numerically with finite difference method. The calculated results show that the thermal agitation durin...

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Main Authors: Hongguang Cheng, Ning Deng
Format: Article
Language:English
Published: AIP Publishing LLC 2013-12-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.4858423
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author Hongguang Cheng
Ning Deng
author_facet Hongguang Cheng
Ning Deng
author_sort Hongguang Cheng
collection DOAJ
description We investigated the influence of thermal agitation on the electric field induced precessional magnetization switching probability with perpendicular easy axis by solving the Fokker-Planck equation numerically with finite difference method. The calculated results show that the thermal agitation during the reversal process crucially influences the switching probability. The switching probability can be achieved is only determined by the thermal stability factor Δ of the free layer, it is independent on the device dimension, which is important for the high density device application. Ultra-low error rate down to the order of 10−9 can be achieved for the device of thermal stability factor Δ of 40. Low damping factor α material should be used for the free layer for high reliability device applications. These results exhibit potential of electric field induced precessional magnetization switching with perpendicular easy axis for ultra-low power, high speed and high density magnetic random access memory (MRAM) applications.
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spelling doaj.art-649b456dc593498596c169a06bd644192022-12-21T18:27:17ZengAIP Publishing LLCAIP Advances2158-32262013-12-01312122124122124-610.1063/1.4858423018312ADVInfluence of thermal agitation on the electric field induced precessional magnetization reversal with perpendicular easy axisHongguang Cheng0Ning Deng1Institute of Microelectronics, Tsinghua University, Beijing 100084, P. R. ChinaInstitute of Microelectronics, Tsinghua University, Beijing 100084, P. R. ChinaWe investigated the influence of thermal agitation on the electric field induced precessional magnetization switching probability with perpendicular easy axis by solving the Fokker-Planck equation numerically with finite difference method. The calculated results show that the thermal agitation during the reversal process crucially influences the switching probability. The switching probability can be achieved is only determined by the thermal stability factor Δ of the free layer, it is independent on the device dimension, which is important for the high density device application. Ultra-low error rate down to the order of 10−9 can be achieved for the device of thermal stability factor Δ of 40. Low damping factor α material should be used for the free layer for high reliability device applications. These results exhibit potential of electric field induced precessional magnetization switching with perpendicular easy axis for ultra-low power, high speed and high density magnetic random access memory (MRAM) applications.http://dx.doi.org/10.1063/1.4858423
spellingShingle Hongguang Cheng
Ning Deng
Influence of thermal agitation on the electric field induced precessional magnetization reversal with perpendicular easy axis
AIP Advances
title Influence of thermal agitation on the electric field induced precessional magnetization reversal with perpendicular easy axis
title_full Influence of thermal agitation on the electric field induced precessional magnetization reversal with perpendicular easy axis
title_fullStr Influence of thermal agitation on the electric field induced precessional magnetization reversal with perpendicular easy axis
title_full_unstemmed Influence of thermal agitation on the electric field induced precessional magnetization reversal with perpendicular easy axis
title_short Influence of thermal agitation on the electric field induced precessional magnetization reversal with perpendicular easy axis
title_sort influence of thermal agitation on the electric field induced precessional magnetization reversal with perpendicular easy axis
url http://dx.doi.org/10.1063/1.4858423
work_keys_str_mv AT hongguangcheng influenceofthermalagitationontheelectricfieldinducedprecessionalmagnetizationreversalwithperpendiculareasyaxis
AT ningdeng influenceofthermalagitationontheelectricfieldinducedprecessionalmagnetizationreversalwithperpendiculareasyaxis