Transfer Learning Based Data Feature Transfer for Fault Diagnosis
The development of sensor technology provides massive data for data-driven fault diagnosis. In recent years, more and more scholars are studying artificial intelligence technology to solve the bottleneck in fault diagnosis. Compared with other classification and prediction problems, fault diagnosis...
Main Authors: | Wei Xu, Yi Wan, Tian-Yu Zuo, Xin-Mei Sha |
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Format: | Article |
Language: | English |
Published: |
IEEE
2020-01-01
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Series: | IEEE Access |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/9076175/ |
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