Experimental Investigations of State-of-the-Art 650-V Class Power MOSFETs for Cryogenic Power Conversion at 77K
With consideration of both the operating properties from cryogenic MOSFETs and refrigerating costs from cryogenic refrigerators, this paper attempts to carry out the experimental tests and performance evaluations of state-of-the-art 650-V class MOSFETs, and thus to explore a possible design guidelin...
Main Authors: | Yu Chen, Xiao-Yuan Chen, Tao Li, Ying-Jun Feng, Yang Liu, Qin Huang, Meng-Yao Li, Lei Zeng |
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Format: | Article |
Language: | English |
Published: |
IEEE
2018-01-01
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Series: | IEEE Journal of the Electron Devices Society |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/8063862/ |
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