Structural and morphological properties of CdSe1-xSx thin films obtained by the method of high-frequency magnetron sputtering
CdSe1-xSx (x= 0.3, 0.4 and 0.6) thin films were deposited on quartz and silicon substrates by the method of high-frequency magnetron sputtering. The chemical composition analysis and crystal structure refinement was examined with using X-ray fluorescence spectroscopy and X-ray diffraction data. CdSe...
| Những tác giả chính: | , , , , |
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| Định dạng: | Bài viết |
| Ngôn ngữ: | English |
| Được phát hành: |
Vasyl Stefanyk Precarpathian National University
2024-02-01
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| Loạt: | Фізика і хімія твердого тіла |
| Những chủ đề: | |
| Truy cập trực tuyến: | https://journals.pnu.edu.ua/index.php/pcss/article/view/7149 |