Contactless Measurement of Sheet Resistance of Nanomaterial Using Waveguide Reflection Method
Conductive nanomaterials are widely studied and used. The four-point probe method has been widely used to measure nanomaterials’ sheet resistance, denoted as <inline-formula><math display="inline"><semantics><mrow><msub><mi>R</mi><mi>s</mi...
| Main Authors: | , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2020-11-01
|
| Series: | Materials |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1996-1944/13/22/5240 |