Fourier Ptychography-Based Measurement of Beam Divergence Angle for Vertical Cavity Surface-Emitting Laser
The Vertical Cavity Surface-Emitting Laser (VCSEL) has led to the rapid development of advanced fields such as communication, optical sensing, smart cars, and more. The accurate testing of VCSEL beam quality is an important prerequisite for its effective application. In this paper, a method for meas...
| Үндсэн зохиолчид: | , , |
|---|---|
| Формат: | Өгүүллэг |
| Хэл сонгох: | English |
| Хэвлэсэн: |
MDPI AG
2023-07-01
|
| Цуврал: | Photonics |
| Нөхцлүүд: | |
| Онлайн хандалт: | https://www.mdpi.com/2304-6732/10/7/777 |