Radiation Damage of Polydimethylsiloxane and Polyimide by X-ray Free-Electron Laser

Radiation Damage of Polydimethylsiloxane and Polyimide by X-ray Free-Electron Laser

A crystal delivery system is essential in serial femtosecond crystallography experiments using an X-ray free-electron laser (XFEL). Investigating the XFEL-induced radiation damage to materials potentially applicable to sample delivery devices is vital for developing a sample delivery system. In this...

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Bibliographic Details
Main Authors: Keondo Lee, Donghyeon Lee, Sangwon Baek, Jihan Kim, Jaehyun Park, Sang Jae Lee, Sehan Park, Jangwoo Kim, Jong-Lam Lee, Wan Kyun Chung, Yunje Cho, Ki Hyun Nam
Format: Article
Language:English
Published: MDPI AG 2022-08-01
Series:Applied Sciences
Subjects:
X-ray free-electron laser
radiation damage
polydimethylsiloxane
polyimide
serial femtosecond crystallography
sample delivery
Online Access:https://www.mdpi.com/2076-3417/12/17/8431

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https://www.mdpi.com/2076-3417/12/17/8431

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