Radiation Damage of Polydimethylsiloxane and Polyimide by X-ray Free-Electron Laser
A crystal delivery system is essential in serial femtosecond crystallography experiments using an X-ray free-electron laser (XFEL). Investigating the XFEL-induced radiation damage to materials potentially applicable to sample delivery devices is vital for developing a sample delivery system. In this...
Main Authors: | Keondo Lee, Donghyeon Lee, Sangwon Baek, Jihan Kim, Jaehyun Park, Sang Jae Lee, Sehan Park, Jangwoo Kim, Jong-Lam Lee, Wan Kyun Chung, Yunje Cho, Ki Hyun Nam |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2022-08-01
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Series: | Applied Sciences |
Subjects: | |
Online Access: | https://www.mdpi.com/2076-3417/12/17/8431 |
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