Improvement of memory performance of 3-D NAND flash memory with retrograde channel doping
The examination of the effect of retrograde channel doping on reliability and performance of 3-D junction-free NAND based flash memory is done for this paper. Specifically, we study the program characteristics, data retention capability junction-free NAND flash memory with half pitch range from 35 n...
Main Authors: | Deepika Gupta, Abhishek Kumar Upadhyay, Ankur Beohar, Santosh Kumar Vishvakarma |
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Format: | Article |
Language: | English |
Published: |
Elsevier
2023-07-01
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Series: | Memories - Materials, Devices, Circuits and Systems |
Subjects: | |
Online Access: | http://www.sciencedirect.com/science/article/pii/S2773064623000087 |
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