Effect of Cd/As flux ratio and annealing process on the transport properties of Cd3As2 films grown by molecular beam epitaxy

To study how the Cd/As flux ratio affects the microstructure and transport properties for Cd _3 As _2 films, we used molecular beam epitaxy (MBE) to grow Cd _3 As _2 (224) thin films on CdTe (111)/GaAs (001) virtual substrates. The effects of Cd/As flux ratio, during the grown process, on the electr...

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Main Authors: Sheng Xi Zhang, Jian Zhang, Yan Wu, Ting Ting Kang, Ning Li, X F Qiu, P P Chen
Format: Article
Language:English
Published: IOP Publishing 2020-01-01
Series:Materials Research Express
Subjects:
Online Access:https://doi.org/10.1088/2053-1591/abc048
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author Sheng Xi Zhang
Jian Zhang
Yan Wu
Ting Ting Kang
Ning Li
X F Qiu
P P Chen
author_facet Sheng Xi Zhang
Jian Zhang
Yan Wu
Ting Ting Kang
Ning Li
X F Qiu
P P Chen
author_sort Sheng Xi Zhang
collection DOAJ
description To study how the Cd/As flux ratio affects the microstructure and transport properties for Cd _3 As _2 films, we used molecular beam epitaxy (MBE) to grow Cd _3 As _2 (224) thin films on CdTe (111)/GaAs (001) virtual substrates. The effects of Cd/As flux ratio, during the grown process, on the electrical properties and surface morphology of the sample was studied. The films grown at lower Cd/As flux ratio have higher electron mobility and longer effective dephasing length. With decreasing Cd/As flux ratio, the magnetoresistance (MR) of the film changes from negative to positive. These results show that a lower beam ratio is beneficial to improve the crystal quality. In order to optimize the electrical properties of the films, the effect of annealing on the electron mobility and MR have been studied. After annealing, the MR changes from negative to positive, the electron mobility increase by 8 times, and the MR increase from 15% to 360% at 9 T. These results indicate that annealing is an effective method to optimize the electrical properties of Cd _3 As _2 epitaxial films.
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spelling doaj.art-6801abb8c1cb48da9b515066083df21e2023-08-09T15:51:13ZengIOP PublishingMaterials Research Express2053-15912020-01-0171010640510.1088/2053-1591/abc048Effect of Cd/As flux ratio and annealing process on the transport properties of Cd3As2 films grown by molecular beam epitaxySheng Xi Zhang0https://orcid.org/0000-0002-6695-2309Jian Zhang1https://orcid.org/0000-0002-4019-6752Yan Wu2Ting Ting Kang3Ning Li4X F Qiu5P P Chen6State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, People’s Republic of China; University of Chinese Academy of Sciences , 19 Yuquan Road, Beijing 100049, People’s Republic of ChinaState Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, People’s Republic of China; University of Chinese Academy of Sciences , 19 Yuquan Road, Beijing 100049, People’s Republic of ChinaState Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, People’s Republic of ChinaState Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, People’s Republic of ChinaState Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, People’s Republic of ChinaState Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, People’s Republic of ChinaState Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, People’s Republic of China; University of Chinese Academy of Sciences , 19 Yuquan Road, Beijing 100049, People’s Republic of ChinaTo study how the Cd/As flux ratio affects the microstructure and transport properties for Cd _3 As _2 films, we used molecular beam epitaxy (MBE) to grow Cd _3 As _2 (224) thin films on CdTe (111)/GaAs (001) virtual substrates. The effects of Cd/As flux ratio, during the grown process, on the electrical properties and surface morphology of the sample was studied. The films grown at lower Cd/As flux ratio have higher electron mobility and longer effective dephasing length. With decreasing Cd/As flux ratio, the magnetoresistance (MR) of the film changes from negative to positive. These results show that a lower beam ratio is beneficial to improve the crystal quality. In order to optimize the electrical properties of the films, the effect of annealing on the electron mobility and MR have been studied. After annealing, the MR changes from negative to positive, the electron mobility increase by 8 times, and the MR increase from 15% to 360% at 9 T. These results indicate that annealing is an effective method to optimize the electrical properties of Cd _3 As _2 epitaxial films.https://doi.org/10.1088/2053-1591/abc048Cd3As2MBEflux ratioannealingmagnetoresistance
spellingShingle Sheng Xi Zhang
Jian Zhang
Yan Wu
Ting Ting Kang
Ning Li
X F Qiu
P P Chen
Effect of Cd/As flux ratio and annealing process on the transport properties of Cd3As2 films grown by molecular beam epitaxy
Materials Research Express
Cd3As2
MBE
flux ratio
annealing
magnetoresistance
title Effect of Cd/As flux ratio and annealing process on the transport properties of Cd3As2 films grown by molecular beam epitaxy
title_full Effect of Cd/As flux ratio and annealing process on the transport properties of Cd3As2 films grown by molecular beam epitaxy
title_fullStr Effect of Cd/As flux ratio and annealing process on the transport properties of Cd3As2 films grown by molecular beam epitaxy
title_full_unstemmed Effect of Cd/As flux ratio and annealing process on the transport properties of Cd3As2 films grown by molecular beam epitaxy
title_short Effect of Cd/As flux ratio and annealing process on the transport properties of Cd3As2 films grown by molecular beam epitaxy
title_sort effect of cd as flux ratio and annealing process on the transport properties of cd3as2 films grown by molecular beam epitaxy
topic Cd3As2
MBE
flux ratio
annealing
magnetoresistance
url https://doi.org/10.1088/2053-1591/abc048
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