Surface morphology and optical properties of InGaN quantum dots with varying growth interruption time

The effect of different growth interruption time on the surface morphology and optical properties of InGaN quantum dots (QDs) grown on 2-inch silicon substrates is investigated. The surface becomes rougher and the photoluminescence intensity has been enhanced significantly when employing the growth...

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Main Authors: Yangfeng Li, Zijing Jin, Yu Han, Chunyu Zhao, Jie Huang, Chak Wah Tang, Jiannong Wang, Kei May Lau
Format: Article
Language:English
Published: IOP Publishing 2019-01-01
Series:Materials Research Express
Subjects:
Online Access:https://doi.org/10.1088/2053-1591/ab5be0
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author Yangfeng Li
Zijing Jin
Yu Han
Chunyu Zhao
Jie Huang
Chak Wah Tang
Jiannong Wang
Kei May Lau
author_facet Yangfeng Li
Zijing Jin
Yu Han
Chunyu Zhao
Jie Huang
Chak Wah Tang
Jiannong Wang
Kei May Lau
author_sort Yangfeng Li
collection DOAJ
description The effect of different growth interruption time on the surface morphology and optical properties of InGaN quantum dots (QDs) grown on 2-inch silicon substrates is investigated. The surface becomes rougher and the photoluminescence intensity has been enhanced significantly when employing the growth interruption method. Temperature-dependent photoluminescence and excitation power-dependent photoluminescence both present unchanged peak energy and line-width of QDs. The sharp increase of PL intensity in medium temperature regime is attributed to the fingerprint of the existence of InGaN QDs. The shape of the QDs are further confirmed by the transmission electron microscopy with a size of 3 nm by 4 nm. Among the samples, a growth interruption time of 30 s gives the best optical performance.
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spelling doaj.art-68261742b013488492a1e96c306db7042023-08-09T15:22:11ZengIOP PublishingMaterials Research Express2053-15912019-01-017101590310.1088/2053-1591/ab5be0Surface morphology and optical properties of InGaN quantum dots with varying growth interruption timeYangfeng Li0https://orcid.org/0000-0001-9896-9116Zijing Jin1Yu Han2https://orcid.org/0000-0002-0177-5639Chunyu Zhao3Jie Huang4Chak Wah Tang5Jiannong Wang6Kei May Lau7Department of Electronic and Computer Engineering, The Hong Kong University of Science and Technology , Clear Water Bay, Kowloon, Hong KongDepartment of Physics, The Hong Kong University of Science and Technology , Clear Water Bay, Kowloon, Hong KongDepartment of Electronic and Computer Engineering, The Hong Kong University of Science and Technology , Clear Water Bay, Kowloon, Hong KongDepartment of Electronic and Computer Engineering, The Hong Kong University of Science and Technology , Clear Water Bay, Kowloon, Hong Kong; Department of Physics, The Hong Kong University of Science and Technology , Clear Water Bay, Kowloon, Hong KongDepartment of Electronic and Computer Engineering, The Hong Kong University of Science and Technology , Clear Water Bay, Kowloon, Hong KongDepartment of Electronic and Computer Engineering, The Hong Kong University of Science and Technology , Clear Water Bay, Kowloon, Hong KongDepartment of Physics, The Hong Kong University of Science and Technology , Clear Water Bay, Kowloon, Hong KongDepartment of Electronic and Computer Engineering, The Hong Kong University of Science and Technology , Clear Water Bay, Kowloon, Hong KongThe effect of different growth interruption time on the surface morphology and optical properties of InGaN quantum dots (QDs) grown on 2-inch silicon substrates is investigated. The surface becomes rougher and the photoluminescence intensity has been enhanced significantly when employing the growth interruption method. Temperature-dependent photoluminescence and excitation power-dependent photoluminescence both present unchanged peak energy and line-width of QDs. The sharp increase of PL intensity in medium temperature regime is attributed to the fingerprint of the existence of InGaN QDs. The shape of the QDs are further confirmed by the transmission electron microscopy with a size of 3 nm by 4 nm. Among the samples, a growth interruption time of 30 s gives the best optical performance.https://doi.org/10.1088/2053-1591/ab5be0InGaN QDsAFMTDPLexcitation power-dependent PLTEM
spellingShingle Yangfeng Li
Zijing Jin
Yu Han
Chunyu Zhao
Jie Huang
Chak Wah Tang
Jiannong Wang
Kei May Lau
Surface morphology and optical properties of InGaN quantum dots with varying growth interruption time
Materials Research Express
InGaN QDs
AFM
TDPL
excitation power-dependent PL
TEM
title Surface morphology and optical properties of InGaN quantum dots with varying growth interruption time
title_full Surface morphology and optical properties of InGaN quantum dots with varying growth interruption time
title_fullStr Surface morphology and optical properties of InGaN quantum dots with varying growth interruption time
title_full_unstemmed Surface morphology and optical properties of InGaN quantum dots with varying growth interruption time
title_short Surface morphology and optical properties of InGaN quantum dots with varying growth interruption time
title_sort surface morphology and optical properties of ingan quantum dots with varying growth interruption time
topic InGaN QDs
AFM
TDPL
excitation power-dependent PL
TEM
url https://doi.org/10.1088/2053-1591/ab5be0
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