Examination of smooth surfaces roughness using angle scatterometer. Part 1. The method of measurement. The measurement instrument

The basic parameters of surface roughness are described in this article. The method of calculation of these parameters from measurement of BSDF function characterizing scatter from surface is shown. Automated angle scatterometer, built at the Institute of Optoelectronics of the Military University o...

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Main Author: Andrzej Pawlata
Format: Article
Language:English
Published: Military University of Technology, Warsaw 2015-03-01
Series:Biuletyn Wojskowej Akademii Technicznej
Subjects:
Online Access:http://biuletynwat.pl/icid/1145426
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author Andrzej Pawlata
author_facet Andrzej Pawlata
author_sort Andrzej Pawlata
collection DOAJ
description The basic parameters of surface roughness are described in this article. The method of calculation of these parameters from measurement of BSDF function characterizing scatter from surface is shown. Automated angle scatterometer, built at the Institute of Optoelectronics of the Military University of Technology (IOE MUT), used for measurements of above parameters is described.[b]Keywords[/b]: surface roughness, scattering, BSDF function, scatterometer
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publisher Military University of Technology, Warsaw
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spelling doaj.art-686629926c394a4e9d93c0a3450b7e192023-08-02T04:56:50ZengMilitary University of Technology, WarsawBiuletyn Wojskowej Akademii Technicznej1234-58652015-03-01641475810.5604/12345865.11454261145426Examination of smooth surfaces roughness using angle scatterometer. Part 1. The method of measurement. The measurement instrumentAndrzej Pawlata0Wojskowa Akademia Techniczna, Instytut Optoelektroniki, 00-908 Warszawa, ul. Kaliskiego 2The basic parameters of surface roughness are described in this article. The method of calculation of these parameters from measurement of BSDF function characterizing scatter from surface is shown. Automated angle scatterometer, built at the Institute of Optoelectronics of the Military University of Technology (IOE MUT), used for measurements of above parameters is described.[b]Keywords[/b]: surface roughness, scattering, BSDF function, scatterometerhttp://biuletynwat.pl/icid/1145426surface roughnessscatteringBSDF functionscatterometer
spellingShingle Andrzej Pawlata
Examination of smooth surfaces roughness using angle scatterometer. Part 1. The method of measurement. The measurement instrument
Biuletyn Wojskowej Akademii Technicznej
surface roughness
scattering
BSDF function
scatterometer
title Examination of smooth surfaces roughness using angle scatterometer. Part 1. The method of measurement. The measurement instrument
title_full Examination of smooth surfaces roughness using angle scatterometer. Part 1. The method of measurement. The measurement instrument
title_fullStr Examination of smooth surfaces roughness using angle scatterometer. Part 1. The method of measurement. The measurement instrument
title_full_unstemmed Examination of smooth surfaces roughness using angle scatterometer. Part 1. The method of measurement. The measurement instrument
title_short Examination of smooth surfaces roughness using angle scatterometer. Part 1. The method of measurement. The measurement instrument
title_sort examination of smooth surfaces roughness using angle scatterometer part 1 the method of measurement the measurement instrument
topic surface roughness
scattering
BSDF function
scatterometer
url http://biuletynwat.pl/icid/1145426
work_keys_str_mv AT andrzejpawlata examinationofsmoothsurfacesroughnessusinganglescatterometerpart1themethodofmeasurementthemeasurementinstrument