Enhancement of DUBAL Network Operational Performance Using Resistive High Temperature Superconducting Fault Current Limiter

Power systems under expansion suffer from escalating fault levels that impact equipment integrity, operational flexibility, and the overall security of the system. The fault current limiter (FCL) is one of approaches used by utilities to limit fault current levels and in Dubai Aluminum (DUBAL) serie...

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Bibliographic Details
Main Authors: Hamood Naji, Noureddine Harid, Huw Griffiths
Format: Article
Language:English
Published: MDPI AG 2019-08-01
Series:Energies
Subjects:
Online Access:https://www.mdpi.com/1996-1073/12/15/3007
Description
Summary:Power systems under expansion suffer from escalating fault levels that impact equipment integrity, operational flexibility, and the overall security of the system. The fault current limiter (FCL) is one of approaches used by utilities to limit fault current levels and in Dubai Aluminum (DUBAL) series current limiting reactors are currently used. However, more effective (FCL) topologies are sought and, in this paper, a case study is proposed using resistive high temperature superconducting fault current limiters (HT-SFCLs). The application of HT-SCFLs is aimed here at reducing short-circuit currents, while at the same time enhancing the stability and security of the network. The study involves analysis of three-phase and single-line-to-ground faults, evaluation of the voltage levels and total harmonic distortion (THD) levels at busbars considering different fault scenarios, and demonstrates how the use of HT-SFCLs at various locations improves the plant performance. The ideal HT-SFCL model is adopted for this analysis since the aim is to look at the steady-state performance rather than the transient performance. Comparison with series reactor FCLs which are currently installed in the plant show better performance with the proposed HT-SFCL. Voltage profile values and total harmonic content were also compared with measurement data available at the plant.
ISSN:1996-1073