APA (7th ed.) Citation

Xu, M., Zhou, Z., Ahbe, T., Peiner, E., & Brand, U. (2022). Using a Tip Characterizer to Investigate Microprobe Silicon Tip Geometry Variation in Roughness Measurements. MDPI AG.

Chicago Style (17th ed.) Citation

Xu, Min, Ziqi Zhou, Thomas Ahbe, Erwin Peiner, and Uwe Brand. Using a Tip Characterizer to Investigate Microprobe Silicon Tip Geometry Variation in Roughness Measurements. MDPI AG, 2022.

MLA (9th ed.) Citation

Xu, Min, et al. Using a Tip Characterizer to Investigate Microprobe Silicon Tip Geometry Variation in Roughness Measurements. MDPI AG, 2022.