Using a Tip Characterizer to Investigate Microprobe Silicon Tip Geometry Variation in Roughness Measurements
Given their superior dynamics, microprobes represent promising probe candidates for high-speed roughness measurement applications. Their disadvantage, however, lies in the fact that the volume of the microprobe’s silicon tip decreases dramatically during roughness measurement, and the unstable tip g...
Main Authors: | Min Xu, Ziqi Zhou, Thomas Ahbe, Erwin Peiner, Uwe Brand |
---|---|
Format: | Article |
Language: | English |
Published: |
MDPI AG
2022-02-01
|
Series: | Sensors |
Subjects: | |
Online Access: | https://www.mdpi.com/1424-8220/22/3/1298 |
Similar Items
-
Investigating the Trackability of Silicon Microprobes in High-Speed Surface Measurements
by: Min Xu, et al.
Published: (2021-02-01) -
In-Line Measurement of the Surface Texture of Rolls Using Long Slender Piezoresistive Microprobes
by: Linus Teir, et al.
Published: (2021-09-01) -
Long Slender Piezo-Resistive Silicon Microprobes for Fast Measurements of Roughness and Mechanical Properties inside Micro-Holes with Diameters below 100 µm
by: Uwe Brand, et al.
Published: (2019-03-01) -
Customized piezoresistive microprobes for combined imaging of topography and mechanical properties
by: Michael Fahrbach, et al.
Published: (2021-06-01) -
Electron microprobe analysis/
by: 220228 Reed, S. J. B.
Published: (1975)