半导体长波长异质结构材料光压谱测试探讨
本文介绍了InP、InGaAs、InGaP、InGaAsP等的光压港(PVS)。并把InGaAsP(在特定组份下)的PVS与FFT—PL谱进行了比较;分析和讨论了PVS测试的局限性和复杂性;指出了对多层异质结构材料,只有把器件结构、外延工艺、ECV测试等结合起来,才可能正确地理解PVS给出的测试结果。...
Main Author: | 丁国庆 |
---|---|
Format: | Article |
Language: | zho |
Published: |
《光通信研究》编辑部
1994-01-01
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Series: | Guangtongxin yanjiu |
Subjects: | |
Online Access: | http://www.gtxyj.com.cn/thesisDetails?columnId=27502966&Fpath=home&index=0 |
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