IGBT Remaining Useful Life Prediction Based on Particle Filter With Fusing Precursor
The remaining useful life (RUL) prediction is essential for the IGBT module when setting a reasonable maintenance schedule and improving IGBT reliability by design. In this article, an RUL prediction method is proposed based on the particle filter (P.F.) algorithm with a multi-parameter precursor de...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
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IEEE
2020-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9174994/ |
| _version_ | 1818933995025465344 |
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| author | Zhen Rao Meng Huang Xiaoming Zha |
| author_facet | Zhen Rao Meng Huang Xiaoming Zha |
| author_sort | Zhen Rao |
| collection | DOAJ |
| description | The remaining useful life (RUL) prediction is essential for the IGBT module when setting a reasonable maintenance schedule and improving IGBT reliability by design. In this article, an RUL prediction method is proposed based on the particle filter (P.F.) algorithm with a multi-parameter precursor developed from the IGBT aging data. By fusing the junction temperature (Tj) and collector-emitter on voltage(V<sub>CE(on)</sub>), a new fault precursor is established to monitor IGBTs' condition. A simplified aging model of the precursor is also developed based on a two-stage fitting. After input the historical aging data of the selected IGBT module, the RUL of IGBT can be predicted by the proposed fault precursor based on P.F. algorithm. According to the aging data collected from accelerated aging experiments, the performance of RUL prediction using the fusing precursor is superior to those with the single parameter precursor. |
| first_indexed | 2024-12-20T04:57:14Z |
| format | Article |
| id | doaj.art-69445dd54ebd4a098c9754efaafb9da6 |
| institution | Directory Open Access Journal |
| issn | 2169-3536 |
| language | English |
| last_indexed | 2024-12-20T04:57:14Z |
| publishDate | 2020-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Access |
| spelling | doaj.art-69445dd54ebd4a098c9754efaafb9da62022-12-21T19:52:41ZengIEEEIEEE Access2169-35362020-01-01815428115428910.1109/ACCESS.2020.30179499174994IGBT Remaining Useful Life Prediction Based on Particle Filter With Fusing PrecursorZhen Rao0https://orcid.org/0000-0003-0882-1316Meng Huang1https://orcid.org/0000-0002-0139-9178Xiaoming Zha2https://orcid.org/0000-0002-1102-891XSchool of Electrical Engineering and Automation, Wuhan University, Wuhan, ChinaSchool of Electrical Engineering and Automation, Wuhan University, Wuhan, ChinaSchool of Electrical Engineering and Automation, Wuhan University, Wuhan, ChinaThe remaining useful life (RUL) prediction is essential for the IGBT module when setting a reasonable maintenance schedule and improving IGBT reliability by design. In this article, an RUL prediction method is proposed based on the particle filter (P.F.) algorithm with a multi-parameter precursor developed from the IGBT aging data. By fusing the junction temperature (Tj) and collector-emitter on voltage(V<sub>CE(on)</sub>), a new fault precursor is established to monitor IGBTs' condition. A simplified aging model of the precursor is also developed based on a two-stage fitting. After input the historical aging data of the selected IGBT module, the RUL of IGBT can be predicted by the proposed fault precursor based on P.F. algorithm. According to the aging data collected from accelerated aging experiments, the performance of RUL prediction using the fusing precursor is superior to those with the single parameter precursor.https://ieeexplore.ieee.org/document/9174994/IGBTcondition monitoringRUL predictionreliability |
| spellingShingle | Zhen Rao Meng Huang Xiaoming Zha IGBT Remaining Useful Life Prediction Based on Particle Filter With Fusing Precursor IEEE Access IGBT condition monitoring RUL prediction reliability |
| title | IGBT Remaining Useful Life Prediction Based on Particle Filter With Fusing Precursor |
| title_full | IGBT Remaining Useful Life Prediction Based on Particle Filter With Fusing Precursor |
| title_fullStr | IGBT Remaining Useful Life Prediction Based on Particle Filter With Fusing Precursor |
| title_full_unstemmed | IGBT Remaining Useful Life Prediction Based on Particle Filter With Fusing Precursor |
| title_short | IGBT Remaining Useful Life Prediction Based on Particle Filter With Fusing Precursor |
| title_sort | igbt remaining useful life prediction based on particle filter with fusing precursor |
| topic | IGBT condition monitoring RUL prediction reliability |
| url | https://ieeexplore.ieee.org/document/9174994/ |
| work_keys_str_mv | AT zhenrao igbtremainingusefullifepredictionbasedonparticlefilterwithfusingprecursor AT menghuang igbtremainingusefullifepredictionbasedonparticlefilterwithfusingprecursor AT xiaomingzha igbtremainingusefullifepredictionbasedonparticlefilterwithfusingprecursor |