Near-surface defect detection in additively manufactured components using laser induced phased arrays with surface acoustic wave crosstalk suppression
In-process inspection of the additive manufacturing process requires a technique that can provide reliable measurements given the extreme operating environments, the small size of the defects and the cyclic melting and heating of the material, caused by subsequently deposited layers. A remote and co...
| Main Authors: | , , , , , , , , , , , |
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| Format: | Article |
| Language: | English |
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Elsevier
2023-12-01
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| Series: | Materials & Design |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S0264127523008687 |
| _version_ | 1797391918294892544 |
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| author | Geo Davis Theodosia Stratoudaki Peter Lukacs Matthew W. Riding Ahmed Al Fuwaires Panagiotis Kamintzis Don Pieris Alan Keenan Paul Wilcox Gareth Pierce Charles MacLeod Stewart Williams |
| author_facet | Geo Davis Theodosia Stratoudaki Peter Lukacs Matthew W. Riding Ahmed Al Fuwaires Panagiotis Kamintzis Don Pieris Alan Keenan Paul Wilcox Gareth Pierce Charles MacLeod Stewart Williams |
| author_sort | Geo Davis |
| collection | DOAJ |
| description | In-process inspection of the additive manufacturing process requires a technique that can provide reliable measurements given the extreme operating environments, the small size of the defects and the cyclic melting and heating of the material, caused by subsequently deposited layers. A remote and couplant-free ultrasonic inspection technique using bulk waves that can image near-surface defects could address these in-process inspection requirements. Laser induced phased arrays (LIPA) generate and detect ultrasound based on laser ultrasonics principles, while the array is synthesised in post-processing. However, when using LIPAs for inspection, the surface acoustic waves (SAWs) interfere with the bulk wave modes giving rise to crosstalk and artefacts, which makes near-surface defect imaging difficult. This work experimentally validates and compares five techniques for SAW suppression: amplitude thresholding, mean waveform subtraction, principal component subtraction, frequency-wavenumber filtering, and phase coherence imaging. SAW suppression is demonstrated in ultrasonic images of transverse waves based on 71-element LIPA data synthesised on a Ti-6Al-4V directed energy deposition-arc (DED-Arc/Ti6Al4V) sample with a ∼1 mm diameter side drilled hole, located at ∼4 mm below the inspected surface. The reported results show that the principal component subtraction approach achieved the highest ‘signal-to-crosstalk ratio’ improvement of 16 dB, while successfully suppressing the SAW. |
| first_indexed | 2024-03-08T23:39:40Z |
| format | Article |
| id | doaj.art-6a46270b832b4098960fb2628890fd55 |
| institution | Directory Open Access Journal |
| issn | 0264-1275 |
| language | English |
| last_indexed | 2024-03-08T23:39:40Z |
| publishDate | 2023-12-01 |
| publisher | Elsevier |
| record_format | Article |
| series | Materials & Design |
| spelling | doaj.art-6a46270b832b4098960fb2628890fd552023-12-14T05:20:18ZengElsevierMaterials & Design0264-12752023-12-01236112453Near-surface defect detection in additively manufactured components using laser induced phased arrays with surface acoustic wave crosstalk suppressionGeo Davis0Theodosia Stratoudaki1Peter Lukacs2Matthew W. Riding3Ahmed Al Fuwaires4Panagiotis Kamintzis5Don Pieris6Alan Keenan7Paul Wilcox8Gareth Pierce9Charles MacLeod10Stewart Williams11Department of Electronic and Electrical Engineering, University of Strathclyde, Glasgow, G1 1XQ, United Kingdom; Corresponding author.Department of Electronic and Electrical Engineering, University of Strathclyde, Glasgow, G1 1XQ, United Kingdom; Corresponding author.Department of Electronic and Electrical Engineering, University of Strathclyde, Glasgow, G1 1XQ, United KingdomDepartment of Electronic and Electrical Engineering, University of Strathclyde, Glasgow, G1 1XQ, United KingdomDepartment of Electronic and Electrical Engineering, University of Strathclyde, Glasgow, G1 1XQ, United KingdomDepartment of Electronic and Electrical Engineering, University of Strathclyde, Glasgow, G1 1XQ, United KingdomDepartment of Electronic and Electrical Engineering, University of Strathclyde, Glasgow, G1 1XQ, United KingdomDepartment of Electronic and Electrical Engineering, University of Strathclyde, Glasgow, G1 1XQ, United KingdomDepartment of Mechanical Engineering, University of Bristol, Bristol, BS8 1Q, United KingdomDepartment of Electronic and Electrical Engineering, University of Strathclyde, Glasgow, G1 1XQ, United KingdomDepartment of Electronic and Electrical Engineering, University of Strathclyde, Glasgow, G1 1XQ, United KingdomWelding and Additive Manufacturing Centre, Cranfield University, Cranfield, MK43 0AL, United KingdomIn-process inspection of the additive manufacturing process requires a technique that can provide reliable measurements given the extreme operating environments, the small size of the defects and the cyclic melting and heating of the material, caused by subsequently deposited layers. A remote and couplant-free ultrasonic inspection technique using bulk waves that can image near-surface defects could address these in-process inspection requirements. Laser induced phased arrays (LIPA) generate and detect ultrasound based on laser ultrasonics principles, while the array is synthesised in post-processing. However, when using LIPAs for inspection, the surface acoustic waves (SAWs) interfere with the bulk wave modes giving rise to crosstalk and artefacts, which makes near-surface defect imaging difficult. This work experimentally validates and compares five techniques for SAW suppression: amplitude thresholding, mean waveform subtraction, principal component subtraction, frequency-wavenumber filtering, and phase coherence imaging. SAW suppression is demonstrated in ultrasonic images of transverse waves based on 71-element LIPA data synthesised on a Ti-6Al-4V directed energy deposition-arc (DED-Arc/Ti6Al4V) sample with a ∼1 mm diameter side drilled hole, located at ∼4 mm below the inspected surface. The reported results show that the principal component subtraction approach achieved the highest ‘signal-to-crosstalk ratio’ improvement of 16 dB, while successfully suppressing the SAW.http://www.sciencedirect.com/science/article/pii/S0264127523008687Additive manufacturingLaser induced phased arraysWave suppressionTotal focusing methodUltrasonic near-surface defect imaging |
| spellingShingle | Geo Davis Theodosia Stratoudaki Peter Lukacs Matthew W. Riding Ahmed Al Fuwaires Panagiotis Kamintzis Don Pieris Alan Keenan Paul Wilcox Gareth Pierce Charles MacLeod Stewart Williams Near-surface defect detection in additively manufactured components using laser induced phased arrays with surface acoustic wave crosstalk suppression Materials & Design Additive manufacturing Laser induced phased arrays Wave suppression Total focusing method Ultrasonic near-surface defect imaging |
| title | Near-surface defect detection in additively manufactured components using laser induced phased arrays with surface acoustic wave crosstalk suppression |
| title_full | Near-surface defect detection in additively manufactured components using laser induced phased arrays with surface acoustic wave crosstalk suppression |
| title_fullStr | Near-surface defect detection in additively manufactured components using laser induced phased arrays with surface acoustic wave crosstalk suppression |
| title_full_unstemmed | Near-surface defect detection in additively manufactured components using laser induced phased arrays with surface acoustic wave crosstalk suppression |
| title_short | Near-surface defect detection in additively manufactured components using laser induced phased arrays with surface acoustic wave crosstalk suppression |
| title_sort | near surface defect detection in additively manufactured components using laser induced phased arrays with surface acoustic wave crosstalk suppression |
| topic | Additive manufacturing Laser induced phased arrays Wave suppression Total focusing method Ultrasonic near-surface defect imaging |
| url | http://www.sciencedirect.com/science/article/pii/S0264127523008687 |
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