Surface morphology analysis of silicon doped with erbium atoms
This scientific work presents an analysis of the structural and electrical properties of light-emitting structures based on a single crystal of silicon doped with the rare earth element. As a result of thermal treatment of the initial samples at a temperature of 1200 ºC, it was found that the surfac...
| Main Authors: | , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2024-01-01
|
| Series: | E3S Web of Conferences |
| Subjects: | |
| Online Access: | https://www.e3s-conferences.org/articles/e3sconf/pdf/2024/38/e3sconf_greenenergy2024_07009.pdf |