Low-dose patterning of platinum nanoclusters on carbon nanotubes by focused-electron-beam-induced deposition as studied by TEM
Focused-electron-beam-induced deposition (FEBID) is used as a direct-write approach to decorate ultrasmall Pt nanoclusters on carbon nanotubes at selected sites in a straightforward maskless manner. The as-deposited nanostructures are studied by transmission electron microscopy (TEM) in 2D and 3D, d...
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Format: | Article |
Language: | English |
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Beilstein-Institut
2013-02-01
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Series: | Beilstein Journal of Nanotechnology |
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Online Access: | https://doi.org/10.3762/bjnano.4.9 |
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author | Xiaoxing Ke Carla Bittencourt Sara Bals Gustaaf Van Tendeloo |
author_facet | Xiaoxing Ke Carla Bittencourt Sara Bals Gustaaf Van Tendeloo |
author_sort | Xiaoxing Ke |
collection | DOAJ |
description | Focused-electron-beam-induced deposition (FEBID) is used as a direct-write approach to decorate ultrasmall Pt nanoclusters on carbon nanotubes at selected sites in a straightforward maskless manner. The as-deposited nanostructures are studied by transmission electron microscopy (TEM) in 2D and 3D, demonstrating that the Pt nanoclusters are well-dispersed, covering the selected areas of the CNT surface completely. The ability of FEBID to graft nanoclusters on multiple sides, through an electron-transparent target within one step, is unique as a physical deposition method. Using high-resolution TEM we have shown that the CNT structure can be well preserved thanks to the low dose used in FEBID. By tuning the electron-beam parameters, the density and distribution of the nanoclusters can be controlled. The purity of as-deposited nanoclusters can be improved by low-energy electron irradiation at room temperature. |
first_indexed | 2024-12-19T08:23:54Z |
format | Article |
id | doaj.art-6a7253d3a4554869a8200bb72fc2bdde |
institution | Directory Open Access Journal |
issn | 2190-4286 |
language | English |
last_indexed | 2024-12-19T08:23:54Z |
publishDate | 2013-02-01 |
publisher | Beilstein-Institut |
record_format | Article |
series | Beilstein Journal of Nanotechnology |
spelling | doaj.art-6a7253d3a4554869a8200bb72fc2bdde2022-12-21T20:29:20ZengBeilstein-InstitutBeilstein Journal of Nanotechnology2190-42862013-02-0141778610.3762/bjnano.4.92190-4286-4-9Low-dose patterning of platinum nanoclusters on carbon nanotubes by focused-electron-beam-induced deposition as studied by TEMXiaoxing Ke0Carla Bittencourt1Sara Bals2Gustaaf Van Tendeloo3EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, BelgiumChemistry of Interaction Plasma Surface (ChiPS), University of Mons, Place du Parc 20, 7000 Mons, BelgiumEMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, BelgiumEMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, BelgiumFocused-electron-beam-induced deposition (FEBID) is used as a direct-write approach to decorate ultrasmall Pt nanoclusters on carbon nanotubes at selected sites in a straightforward maskless manner. The as-deposited nanostructures are studied by transmission electron microscopy (TEM) in 2D and 3D, demonstrating that the Pt nanoclusters are well-dispersed, covering the selected areas of the CNT surface completely. The ability of FEBID to graft nanoclusters on multiple sides, through an electron-transparent target within one step, is unique as a physical deposition method. Using high-resolution TEM we have shown that the CNT structure can be well preserved thanks to the low dose used in FEBID. By tuning the electron-beam parameters, the density and distribution of the nanoclusters can be controlled. The purity of as-deposited nanoclusters can be improved by low-energy electron irradiation at room temperature.https://doi.org/10.3762/bjnano.4.9carbon nanotubesFEBIDnanoclusterplatinumpatterningradiation-induced nanostructuresTEM |
spellingShingle | Xiaoxing Ke Carla Bittencourt Sara Bals Gustaaf Van Tendeloo Low-dose patterning of platinum nanoclusters on carbon nanotubes by focused-electron-beam-induced deposition as studied by TEM Beilstein Journal of Nanotechnology carbon nanotubes FEBID nanocluster platinum patterning radiation-induced nanostructures TEM |
title | Low-dose patterning of platinum nanoclusters on carbon nanotubes by focused-electron-beam-induced deposition as studied by TEM |
title_full | Low-dose patterning of platinum nanoclusters on carbon nanotubes by focused-electron-beam-induced deposition as studied by TEM |
title_fullStr | Low-dose patterning of platinum nanoclusters on carbon nanotubes by focused-electron-beam-induced deposition as studied by TEM |
title_full_unstemmed | Low-dose patterning of platinum nanoclusters on carbon nanotubes by focused-electron-beam-induced deposition as studied by TEM |
title_short | Low-dose patterning of platinum nanoclusters on carbon nanotubes by focused-electron-beam-induced deposition as studied by TEM |
title_sort | low dose patterning of platinum nanoclusters on carbon nanotubes by focused electron beam induced deposition as studied by tem |
topic | carbon nanotubes FEBID nanocluster platinum patterning radiation-induced nanostructures TEM |
url | https://doi.org/10.3762/bjnano.4.9 |
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