Near-maximum microwave absorption in a thin metal film at the pseudo-free-standing limit

Abstract Electromagnetic absorbers based on ultra-thin metallic film are desirable for many applications such as plasmonics, metamaterials, and long-wavelength detectors. A metallic film will achieve a maximum 50% of electromagnetic wave absorption, frequency independent, at a thickness defined by i...

Full description

Bibliographic Details
Main Authors: Mahsa Haddadi. M, Bamadev Das, Jeeyoon Jeong, Sunghwan Kim, Dai-Sik Kim
Format: Article
Language:English
Published: Nature Portfolio 2022-11-01
Series:Scientific Reports
Online Access:https://doi.org/10.1038/s41598-022-23119-7
_version_ 1811223571301662720
author Mahsa Haddadi. M
Bamadev Das
Jeeyoon Jeong
Sunghwan Kim
Dai-Sik Kim
author_facet Mahsa Haddadi. M
Bamadev Das
Jeeyoon Jeong
Sunghwan Kim
Dai-Sik Kim
author_sort Mahsa Haddadi. M
collection DOAJ
description Abstract Electromagnetic absorbers based on ultra-thin metallic film are desirable for many applications such as plasmonics, metamaterials, and long-wavelength detectors. A metallic film will achieve a maximum 50% of electromagnetic wave absorption, frequency independent, at a thickness defined by its conductivity, typically in the sub-Angstrom range for good metals if bulk conductivity is maintained throughout. This makes it extremely difficult to obtain substantial absorption from thin metal films, in contrast to 2D materials such as graphene. Luckily, however, from a practical point of view, metal conductivity is drastically reduced as the film becomes sub-100 nm, to make it a race between the thinnest possible metal thickness experimentally achievable vs the conductivity reduction. Here, we demonstrate a near-50% absorption at a gold film thickness of 6.5 nm, with conductivity much reduced from the bulk value, down to the range of 106 Siemens per meter. Studying the effect of the substrate thickness, we found that the common cover glass, with its thickness much smaller than the wavelength, achieves symmetric absorption of 44%, implying that a pseudo-free-standing limit is achieved. Our work may find applications in infrared sensing as in bolometers and biomedical sensing using microwaves.
first_indexed 2024-04-12T08:35:08Z
format Article
id doaj.art-6a82e8971648448cac3ca78ba4d3ecae
institution Directory Open Access Journal
issn 2045-2322
language English
last_indexed 2024-04-12T08:35:08Z
publishDate 2022-11-01
publisher Nature Portfolio
record_format Article
series Scientific Reports
spelling doaj.art-6a82e8971648448cac3ca78ba4d3ecae2022-12-22T03:40:02ZengNature PortfolioScientific Reports2045-23222022-11-011211710.1038/s41598-022-23119-7Near-maximum microwave absorption in a thin metal film at the pseudo-free-standing limitMahsa Haddadi. M0Bamadev Das1Jeeyoon Jeong2Sunghwan Kim3Dai-Sik Kim4Department of Physics and Quantum Photonics Institute, Ulsan National Institute of Science and Technology (UNIST)Department of Physics and Quantum Photonics Institute, Ulsan National Institute of Science and Technology (UNIST)Department of Physics, Institute of Quantum Convergence Technology, Kangwon National UniversityDepartment of Physics and Quantum Photonics Institute, Ulsan National Institute of Science and Technology (UNIST)Department of Physics and Quantum Photonics Institute, Ulsan National Institute of Science and Technology (UNIST)Abstract Electromagnetic absorbers based on ultra-thin metallic film are desirable for many applications such as plasmonics, metamaterials, and long-wavelength detectors. A metallic film will achieve a maximum 50% of electromagnetic wave absorption, frequency independent, at a thickness defined by its conductivity, typically in the sub-Angstrom range for good metals if bulk conductivity is maintained throughout. This makes it extremely difficult to obtain substantial absorption from thin metal films, in contrast to 2D materials such as graphene. Luckily, however, from a practical point of view, metal conductivity is drastically reduced as the film becomes sub-100 nm, to make it a race between the thinnest possible metal thickness experimentally achievable vs the conductivity reduction. Here, we demonstrate a near-50% absorption at a gold film thickness of 6.5 nm, with conductivity much reduced from the bulk value, down to the range of 106 Siemens per meter. Studying the effect of the substrate thickness, we found that the common cover glass, with its thickness much smaller than the wavelength, achieves symmetric absorption of 44%, implying that a pseudo-free-standing limit is achieved. Our work may find applications in infrared sensing as in bolometers and biomedical sensing using microwaves.https://doi.org/10.1038/s41598-022-23119-7
spellingShingle Mahsa Haddadi. M
Bamadev Das
Jeeyoon Jeong
Sunghwan Kim
Dai-Sik Kim
Near-maximum microwave absorption in a thin metal film at the pseudo-free-standing limit
Scientific Reports
title Near-maximum microwave absorption in a thin metal film at the pseudo-free-standing limit
title_full Near-maximum microwave absorption in a thin metal film at the pseudo-free-standing limit
title_fullStr Near-maximum microwave absorption in a thin metal film at the pseudo-free-standing limit
title_full_unstemmed Near-maximum microwave absorption in a thin metal film at the pseudo-free-standing limit
title_short Near-maximum microwave absorption in a thin metal film at the pseudo-free-standing limit
title_sort near maximum microwave absorption in a thin metal film at the pseudo free standing limit
url https://doi.org/10.1038/s41598-022-23119-7
work_keys_str_mv AT mahsahaddadim nearmaximummicrowaveabsorptioninathinmetalfilmatthepseudofreestandinglimit
AT bamadevdas nearmaximummicrowaveabsorptioninathinmetalfilmatthepseudofreestandinglimit
AT jeeyoonjeong nearmaximummicrowaveabsorptioninathinmetalfilmatthepseudofreestandinglimit
AT sunghwankim nearmaximummicrowaveabsorptioninathinmetalfilmatthepseudofreestandinglimit
AT daisikkim nearmaximummicrowaveabsorptioninathinmetalfilmatthepseudofreestandinglimit