A kiloelectron-volt ultrafast electron micro-diffraction apparatus using low emittance semiconductor photocathodes

We report the design and performance of a time-resolved electron diffraction apparatus capable of producing intense bunches with simultaneously single digit micrometer probe size, long coherence length, and 200 fs rms time resolution. We measure the 5d (peak) beam brightness at the sample location i...

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Main Authors: W. H. Li, C. J. R. Duncan, M. B. Andorf, A. C. Bartnik, E. Bianco, L. Cultrera, A. Galdi, M. Gordon, M. Kaemingk, C. A. Pennington, L. F. Kourkoutis, I. V. Bazarov, J. M. Maxson
Format: Article
Language:English
Published: AIP Publishing LLC and ACA 2022-03-01
Series:Structural Dynamics
Online Access:http://dx.doi.org/10.1063/4.0000138
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author W. H. Li
C. J. R. Duncan
M. B. Andorf
A. C. Bartnik
E. Bianco
L. Cultrera
A. Galdi
M. Gordon
M. Kaemingk
C. A. Pennington
L. F. Kourkoutis
I. V. Bazarov
J. M. Maxson
author_facet W. H. Li
C. J. R. Duncan
M. B. Andorf
A. C. Bartnik
E. Bianco
L. Cultrera
A. Galdi
M. Gordon
M. Kaemingk
C. A. Pennington
L. F. Kourkoutis
I. V. Bazarov
J. M. Maxson
author_sort W. H. Li
collection DOAJ
description We report the design and performance of a time-resolved electron diffraction apparatus capable of producing intense bunches with simultaneously single digit micrometer probe size, long coherence length, and 200 fs rms time resolution. We measure the 5d (peak) beam brightness at the sample location in micro-diffraction mode to be 7 × 10 13   A / m 2   rad 2. To generate high brightness electron bunches, the system employs high efficiency, low emittance semiconductor photocathodes driven with a wavelength near the photoemission threshold at a repetition rate up to 250 kHz. We characterize spatial, temporal, and reciprocal space resolution of the apparatus. We perform proof-of-principle measurements of ultrafast heating in single crystal Au samples and compare experimental results with simulations that account for the effects of multiple scattering.
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spelling doaj.art-6ac30e80a69740f683ef3067f15bdcb42022-12-22T00:28:26ZengAIP Publishing LLC and ACAStructural Dynamics2329-77782022-03-0192024302024302-1110.1063/4.0000138A kiloelectron-volt ultrafast electron micro-diffraction apparatus using low emittance semiconductor photocathodesW. H. Li0C. J. R. Duncan1M. B. Andorf2A. C. Bartnik3E. Bianco4L. Cultrera5A. Galdi6M. Gordon7M. Kaemingk8C. A. Pennington9L. F. Kourkoutis10I. V. Bazarov11J. M. Maxson12 Cornell Laboratory for Accelerator-Based Sciences and Education, Cornell University, Ithaca, New York 14853, USA Cornell Laboratory for Accelerator-Based Sciences and Education, Cornell University, Ithaca, New York 14853, USA Cornell Laboratory for Accelerator-Based Sciences and Education, Cornell University, Ithaca, New York 14853, USA Cornell Laboratory for Accelerator-Based Sciences and Education, Cornell University, Ithaca, New York 14853, USA Kavli Institute at Cornell for Nanoscale Science, Ithaca, New York 14853, USA Cornell Laboratory for Accelerator-Based Sciences and Education, Cornell University, Ithaca, New York 14853, USA Cornell Laboratory for Accelerator-Based Sciences and Education, Cornell University, Ithaca, New York 14853, USA University of Chicago, Chicago, Illinois 60637, USA Cornell Laboratory for Accelerator-Based Sciences and Education, Cornell University, Ithaca, New York 14853, USA Cornell Laboratory for Accelerator-Based Sciences and Education, Cornell University, Ithaca, New York 14853, USA Kavli Institute at Cornell for Nanoscale Science, Ithaca, New York 14853, USA Cornell Laboratory for Accelerator-Based Sciences and Education, Cornell University, Ithaca, New York 14853, USA Cornell Laboratory for Accelerator-Based Sciences and Education, Cornell University, Ithaca, New York 14853, USAWe report the design and performance of a time-resolved electron diffraction apparatus capable of producing intense bunches with simultaneously single digit micrometer probe size, long coherence length, and 200 fs rms time resolution. We measure the 5d (peak) beam brightness at the sample location in micro-diffraction mode to be 7 × 10 13   A / m 2   rad 2. To generate high brightness electron bunches, the system employs high efficiency, low emittance semiconductor photocathodes driven with a wavelength near the photoemission threshold at a repetition rate up to 250 kHz. We characterize spatial, temporal, and reciprocal space resolution of the apparatus. We perform proof-of-principle measurements of ultrafast heating in single crystal Au samples and compare experimental results with simulations that account for the effects of multiple scattering.http://dx.doi.org/10.1063/4.0000138
spellingShingle W. H. Li
C. J. R. Duncan
M. B. Andorf
A. C. Bartnik
E. Bianco
L. Cultrera
A. Galdi
M. Gordon
M. Kaemingk
C. A. Pennington
L. F. Kourkoutis
I. V. Bazarov
J. M. Maxson
A kiloelectron-volt ultrafast electron micro-diffraction apparatus using low emittance semiconductor photocathodes
Structural Dynamics
title A kiloelectron-volt ultrafast electron micro-diffraction apparatus using low emittance semiconductor photocathodes
title_full A kiloelectron-volt ultrafast electron micro-diffraction apparatus using low emittance semiconductor photocathodes
title_fullStr A kiloelectron-volt ultrafast electron micro-diffraction apparatus using low emittance semiconductor photocathodes
title_full_unstemmed A kiloelectron-volt ultrafast electron micro-diffraction apparatus using low emittance semiconductor photocathodes
title_short A kiloelectron-volt ultrafast electron micro-diffraction apparatus using low emittance semiconductor photocathodes
title_sort kiloelectron volt ultrafast electron micro diffraction apparatus using low emittance semiconductor photocathodes
url http://dx.doi.org/10.1063/4.0000138
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