Non-Destructive Direct Pericarp Thickness Measurement of Sorghum Kernels Using Extended-Focus Optical Coherence Microscopy
Non-destructive measurements of internal morphological structures in plant materials such as seeds are of high interest in agricultural research. The estimation of pericarp thickness is important to understand the grain quality and storage stability of seeds and can play a crucial role in improving...
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| Format: | Article |
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MDPI AG
2023-01-01
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| Series: | Sensors |
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| Online Access: | https://www.mdpi.com/1424-8220/23/2/707 |
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| author | Dipankar Sen Alma Fernández Daniel Crozier Brian Henrich Alexei V. Sokolov Marlan O. Scully William L. Rooney Aart J. Verhoef |
| author_facet | Dipankar Sen Alma Fernández Daniel Crozier Brian Henrich Alexei V. Sokolov Marlan O. Scully William L. Rooney Aart J. Verhoef |
| author_sort | Dipankar Sen |
| collection | DOAJ |
| description | Non-destructive measurements of internal morphological structures in plant materials such as seeds are of high interest in agricultural research. The estimation of pericarp thickness is important to understand the grain quality and storage stability of seeds and can play a crucial role in improving crop yield. In this study, we demonstrate the applicability of fiber-based Bessel beam Fourier domain (FD) optical coherence microscopy (OCM) with a nearly constant high lateral resolution maintained at over ~400 µm for direct non-invasive measurement of the pericarp thickness of two different sorghum genotypes. Whereas measurements based on axial profiles need additional knowledge of the pericarp refractive index, en-face views allow for direct distance measurements. We directly determine pericarp thickness from lateral sections with a 3 µm resolution by taking the width of the signal corresponding to the pericarp at the 1/e threshold. These measurements enable differentiation of the two genotypes with 100% accuracy. We find that trading image resolution for acquisition speed and view size reduces the classification accuracy. Average pericarp thicknesses of 74 µm (thick phenotype) and 43 µm (thin phenotype) are obtained from high-resolution lateral sections, and are in good agreement with previously reported measurements of the same genotypes. Extracting the morphological features of plant seeds using Bessel beam FD-OCM is expected to provide valuable information to the food processing industry and plant breeding programs. |
| first_indexed | 2024-03-09T11:18:12Z |
| format | Article |
| id | doaj.art-6bb5d9e36f8f4e449d0c703adc6d5931 |
| institution | Directory Open Access Journal |
| issn | 1424-8220 |
| language | English |
| last_indexed | 2024-03-09T11:18:12Z |
| publishDate | 2023-01-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Sensors |
| spelling | doaj.art-6bb5d9e36f8f4e449d0c703adc6d59312023-12-01T00:26:12ZengMDPI AGSensors1424-82202023-01-0123270710.3390/s23020707Non-Destructive Direct Pericarp Thickness Measurement of Sorghum Kernels Using Extended-Focus Optical Coherence MicroscopyDipankar Sen0Alma Fernández1Daniel Crozier2Brian Henrich3Alexei V. Sokolov4Marlan O. Scully5William L. Rooney6Aart J. Verhoef7Department of Physics & Astronomy, Texas A&M University, TAMU 4242, College Station, TX 77843, USAInstitute for Quantum Science & Engineering, Texas A&M University, TAMU 4242, College Station, TX 77843, USADepartment of Soil and Crop Sciences, Texas A&M University, TAMU 2474, College Station, TX 77843, USADepartment of Soil and Crop Sciences, Texas A&M University, TAMU 2474, College Station, TX 77843, USADepartment of Physics & Astronomy, Texas A&M University, TAMU 4242, College Station, TX 77843, USAInstitute for Quantum Science & Engineering, Texas A&M University, TAMU 4242, College Station, TX 77843, USADepartment of Soil and Crop Sciences, Texas A&M University, TAMU 2474, College Station, TX 77843, USAInstitute for Quantum Science & Engineering, Texas A&M University, TAMU 4242, College Station, TX 77843, USANon-destructive measurements of internal morphological structures in plant materials such as seeds are of high interest in agricultural research. The estimation of pericarp thickness is important to understand the grain quality and storage stability of seeds and can play a crucial role in improving crop yield. In this study, we demonstrate the applicability of fiber-based Bessel beam Fourier domain (FD) optical coherence microscopy (OCM) with a nearly constant high lateral resolution maintained at over ~400 µm for direct non-invasive measurement of the pericarp thickness of two different sorghum genotypes. Whereas measurements based on axial profiles need additional knowledge of the pericarp refractive index, en-face views allow for direct distance measurements. We directly determine pericarp thickness from lateral sections with a 3 µm resolution by taking the width of the signal corresponding to the pericarp at the 1/e threshold. These measurements enable differentiation of the two genotypes with 100% accuracy. We find that trading image resolution for acquisition speed and view size reduces the classification accuracy. Average pericarp thicknesses of 74 µm (thick phenotype) and 43 µm (thin phenotype) are obtained from high-resolution lateral sections, and are in good agreement with previously reported measurements of the same genotypes. Extracting the morphological features of plant seeds using Bessel beam FD-OCM is expected to provide valuable information to the food processing industry and plant breeding programs.https://www.mdpi.com/1424-8220/23/2/707Fourier domain optical coherence microscopyhigher-order-mode fiberlong-period gratingBessel beamspatial resolutionsorghum |
| spellingShingle | Dipankar Sen Alma Fernández Daniel Crozier Brian Henrich Alexei V. Sokolov Marlan O. Scully William L. Rooney Aart J. Verhoef Non-Destructive Direct Pericarp Thickness Measurement of Sorghum Kernels Using Extended-Focus Optical Coherence Microscopy Sensors Fourier domain optical coherence microscopy higher-order-mode fiber long-period grating Bessel beam spatial resolution sorghum |
| title | Non-Destructive Direct Pericarp Thickness Measurement of Sorghum Kernels Using Extended-Focus Optical Coherence Microscopy |
| title_full | Non-Destructive Direct Pericarp Thickness Measurement of Sorghum Kernels Using Extended-Focus Optical Coherence Microscopy |
| title_fullStr | Non-Destructive Direct Pericarp Thickness Measurement of Sorghum Kernels Using Extended-Focus Optical Coherence Microscopy |
| title_full_unstemmed | Non-Destructive Direct Pericarp Thickness Measurement of Sorghum Kernels Using Extended-Focus Optical Coherence Microscopy |
| title_short | Non-Destructive Direct Pericarp Thickness Measurement of Sorghum Kernels Using Extended-Focus Optical Coherence Microscopy |
| title_sort | non destructive direct pericarp thickness measurement of sorghum kernels using extended focus optical coherence microscopy |
| topic | Fourier domain optical coherence microscopy higher-order-mode fiber long-period grating Bessel beam spatial resolution sorghum |
| url | https://www.mdpi.com/1424-8220/23/2/707 |
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