Accurate Crack Detection Based on Distributed Deep Learning for IoT Environment

Defects or cracks in roads, building walls, floors, and product surfaces can degrade the completeness of the product and become an impediment to quality control. Machine learning can be a solution for detecting defects effectively without human experts; however, the low-power computing device cannot...

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Bibliographic Details
Main Authors: Youngpil Kim, Shinuk Yi, Hyunho Ahn, Cheol-Ho Hong
Format: Article
Language:English
Published: MDPI AG 2023-01-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/23/2/858