Remaining Useful Life Prediction of MOSFETs via the Takagi–Sugeno Framework
The paper presents a new method of predicting the remaining useful life of technical devices. The proposed soft computing approach bridges the gap between analytical and data-driven health prognostic approaches. Whilst the former ones are based on the classical exponential shape of degradation, the...
| Main Authors: | , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2021-04-01
|
| Series: | Energies |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1996-1073/14/8/2135 |