The Optimization of Metal Nitride Coupled Plasmon Waveguide Resonance Sensors Using a Genetic Algorithm for Sensing the Thickness and Refractive Index of Diamond-like Carbon Thin Films

We theoretically designed the Kretschmann configuration coupled plasmon-waveguide resonance (CPWR) sensors, composed of thin films of metal nitrides. The thicknesses of the layers of the CPWR sensors were optimized using a genetic algorithm. The optimized CPWR sensors were applied to simultaneously...

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Main Authors: Jaturong Junrear, Panarit Sakunasinha, Surasak Chiangga
Format: Article
Language:English
Published: MDPI AG 2022-05-01
Series:Photonics
Subjects:
Online Access:https://www.mdpi.com/2304-6732/9/5/332
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author Jaturong Junrear
Panarit Sakunasinha
Surasak Chiangga
author_facet Jaturong Junrear
Panarit Sakunasinha
Surasak Chiangga
author_sort Jaturong Junrear
collection DOAJ
description We theoretically designed the Kretschmann configuration coupled plasmon-waveguide resonance (CPWR) sensors, composed of thin films of metal nitrides. The thicknesses of the layers of the CPWR sensors were optimized using a genetic algorithm. The optimized CPWR sensors were applied to simultaneously measure the thickness and refractive index (RI) of diamond-like carbon (DLC) films. The field profiles and the sensitivity of the CPWR sensors in response to thin DLC films were studied using the finite-different time-domain technique and the transfer matrix method. The genetic algorithm method predicted that the two-mode CPWR sensors could simultaneously analyze the thickness and RI of the DLC films as thin as 1.0 nm at a wavelength of 1550 nm. The simulations showed that the angular sensitivity toward the refractive index changes of the DLC films of the optimized CPWR sensors was comparable to that of traditional CPWR sensors.
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spelling doaj.art-6c8fbd23c4824befa8b90b8d96906d4a2023-11-23T12:40:54ZengMDPI AGPhotonics2304-67322022-05-019533210.3390/photonics9050332The Optimization of Metal Nitride Coupled Plasmon Waveguide Resonance Sensors Using a Genetic Algorithm for Sensing the Thickness and Refractive Index of Diamond-like Carbon Thin FilmsJaturong Junrear0Panarit Sakunasinha1Surasak Chiangga2Department of Physics, Faculty of Science, Kasetsart University, Bangkok 10900, ThailandDepartment of Physics, Faculty of Science, Kasetsart University, Bangkok 10900, ThailandDepartment of Physics, Faculty of Science, Kasetsart University, Bangkok 10900, ThailandWe theoretically designed the Kretschmann configuration coupled plasmon-waveguide resonance (CPWR) sensors, composed of thin films of metal nitrides. The thicknesses of the layers of the CPWR sensors were optimized using a genetic algorithm. The optimized CPWR sensors were applied to simultaneously measure the thickness and refractive index (RI) of diamond-like carbon (DLC) films. The field profiles and the sensitivity of the CPWR sensors in response to thin DLC films were studied using the finite-different time-domain technique and the transfer matrix method. The genetic algorithm method predicted that the two-mode CPWR sensors could simultaneously analyze the thickness and RI of the DLC films as thin as 1.0 nm at a wavelength of 1550 nm. The simulations showed that the angular sensitivity toward the refractive index changes of the DLC films of the optimized CPWR sensors was comparable to that of traditional CPWR sensors.https://www.mdpi.com/2304-6732/9/5/332metal nitridessurface plasmon resonancethin filmscoupled plasmon waveguide resonancesensorgenetic algorithm
spellingShingle Jaturong Junrear
Panarit Sakunasinha
Surasak Chiangga
The Optimization of Metal Nitride Coupled Plasmon Waveguide Resonance Sensors Using a Genetic Algorithm for Sensing the Thickness and Refractive Index of Diamond-like Carbon Thin Films
Photonics
metal nitrides
surface plasmon resonance
thin films
coupled plasmon waveguide resonance
sensor
genetic algorithm
title The Optimization of Metal Nitride Coupled Plasmon Waveguide Resonance Sensors Using a Genetic Algorithm for Sensing the Thickness and Refractive Index of Diamond-like Carbon Thin Films
title_full The Optimization of Metal Nitride Coupled Plasmon Waveguide Resonance Sensors Using a Genetic Algorithm for Sensing the Thickness and Refractive Index of Diamond-like Carbon Thin Films
title_fullStr The Optimization of Metal Nitride Coupled Plasmon Waveguide Resonance Sensors Using a Genetic Algorithm for Sensing the Thickness and Refractive Index of Diamond-like Carbon Thin Films
title_full_unstemmed The Optimization of Metal Nitride Coupled Plasmon Waveguide Resonance Sensors Using a Genetic Algorithm for Sensing the Thickness and Refractive Index of Diamond-like Carbon Thin Films
title_short The Optimization of Metal Nitride Coupled Plasmon Waveguide Resonance Sensors Using a Genetic Algorithm for Sensing the Thickness and Refractive Index of Diamond-like Carbon Thin Films
title_sort optimization of metal nitride coupled plasmon waveguide resonance sensors using a genetic algorithm for sensing the thickness and refractive index of diamond like carbon thin films
topic metal nitrides
surface plasmon resonance
thin films
coupled plasmon waveguide resonance
sensor
genetic algorithm
url https://www.mdpi.com/2304-6732/9/5/332
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