Effect of Process Parameters on Mode Conversion in Submicron Tapered Silicon Ridge Waveguides

The modal property and light propagation in tapered silicon ridge waveguides with different ridge heights are investigated for a silicon on insulator (SOI) platform with a 500 nm silicon (Si) thickness. Mode conversion between the transverse magnetic (TM) fundamental and higher-order transverse elec...

Полное описание

Библиографические подробности
Главные авторы: Zakriya Mohammed, Bruna Paredes, Mahmoud Rasras
Формат: Статья
Язык:English
Опубликовано: MDPI AG 2021-03-01
Серии:Applied Sciences
Предметы:
Online-ссылка:https://www.mdpi.com/2076-3417/11/5/2366

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