High-speed dynamic-mode atomic force microscopy imaging of polymers: an adaptive multiloop-mode approach
Adaptive multiloop-mode (AMLM) imaging to substantially increase (over an order of magnitude) the speed of tapping-mode (TM) imaging is tested and evaluated through imaging three largely different heterogeneous polymer samples in experiments. It has been demonstrated that AMLM imaging, through the c...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
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Beilstein-Institut
2017-08-01
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| Series: | Beilstein Journal of Nanotechnology |
| Subjects: | |
| Online Access: | https://doi.org/10.3762/bjnano.8.158 |
| _version_ | 1819071828569620480 |
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| author | Juan Ren Qingze Zou |
| author_facet | Juan Ren Qingze Zou |
| author_sort | Juan Ren |
| collection | DOAJ |
| description | Adaptive multiloop-mode (AMLM) imaging to substantially increase (over an order of magnitude) the speed of tapping-mode (TM) imaging is tested and evaluated through imaging three largely different heterogeneous polymer samples in experiments. It has been demonstrated that AMLM imaging, through the combination of a suite of advanced control techniques, is promising to achieve high-speed dynamic-mode atomic force microscopy imaging. The performance, usability, and robustness of the AMLM in various imaging applications, however, is yet to be assessed. In this work, three benchmark polymer samples, including a PS–LDPE sample, an SBS sample, and a Celgard sample, differing in feature size and stiffness of two orders of magnitude, are imaged using the AMLM technique at high-speeds of 25 Hz and 20 Hz, respectively. The comparison of the images obtained to those obtained by using TM imaging at scan rates of 1 Hz and 2 Hz showed that the quality of the 25 Hz and 20 Hz AMLM imaging is at the same level of that of the 1 Hz TM imaging, while the tip–sample interaction force is substantially smaller than that of the 2 Hz TM imaging. |
| first_indexed | 2024-12-21T17:28:02Z |
| format | Article |
| id | doaj.art-6e2a3770387948348d611e67ad4949e7 |
| institution | Directory Open Access Journal |
| issn | 2190-4286 |
| language | English |
| last_indexed | 2024-12-21T17:28:02Z |
| publishDate | 2017-08-01 |
| publisher | Beilstein-Institut |
| record_format | Article |
| series | Beilstein Journal of Nanotechnology |
| spelling | doaj.art-6e2a3770387948348d611e67ad4949e72022-12-21T18:56:00ZengBeilstein-InstitutBeilstein Journal of Nanotechnology2190-42862017-08-01811563157010.3762/bjnano.8.1582190-4286-8-158High-speed dynamic-mode atomic force microscopy imaging of polymers: an adaptive multiloop-mode approachJuan Ren0Qingze Zou1Department of Mechanical Engineering, Iowa State University, 2030 Black Engineering, Ames, IA 50011, USADepartment of Mechanical and Aerospace Engineering, Rutgers University, 98 Brett Rd, Piscataway, NJ 08854, USAAdaptive multiloop-mode (AMLM) imaging to substantially increase (over an order of magnitude) the speed of tapping-mode (TM) imaging is tested and evaluated through imaging three largely different heterogeneous polymer samples in experiments. It has been demonstrated that AMLM imaging, through the combination of a suite of advanced control techniques, is promising to achieve high-speed dynamic-mode atomic force microscopy imaging. The performance, usability, and robustness of the AMLM in various imaging applications, however, is yet to be assessed. In this work, three benchmark polymer samples, including a PS–LDPE sample, an SBS sample, and a Celgard sample, differing in feature size and stiffness of two orders of magnitude, are imaged using the AMLM technique at high-speeds of 25 Hz and 20 Hz, respectively. The comparison of the images obtained to those obtained by using TM imaging at scan rates of 1 Hz and 2 Hz showed that the quality of the 25 Hz and 20 Hz AMLM imaging is at the same level of that of the 1 Hz TM imaging, while the tip–sample interaction force is substantially smaller than that of the 2 Hz TM imaging.https://doi.org/10.3762/bjnano.8.158adaptive multiloop modeatomic force microscopy (AFM)heterogeneous polymer sampletapping-mode imaging |
| spellingShingle | Juan Ren Qingze Zou High-speed dynamic-mode atomic force microscopy imaging of polymers: an adaptive multiloop-mode approach Beilstein Journal of Nanotechnology adaptive multiloop mode atomic force microscopy (AFM) heterogeneous polymer sample tapping-mode imaging |
| title | High-speed dynamic-mode atomic force microscopy imaging of polymers: an adaptive multiloop-mode approach |
| title_full | High-speed dynamic-mode atomic force microscopy imaging of polymers: an adaptive multiloop-mode approach |
| title_fullStr | High-speed dynamic-mode atomic force microscopy imaging of polymers: an adaptive multiloop-mode approach |
| title_full_unstemmed | High-speed dynamic-mode atomic force microscopy imaging of polymers: an adaptive multiloop-mode approach |
| title_short | High-speed dynamic-mode atomic force microscopy imaging of polymers: an adaptive multiloop-mode approach |
| title_sort | high speed dynamic mode atomic force microscopy imaging of polymers an adaptive multiloop mode approach |
| topic | adaptive multiloop mode atomic force microscopy (AFM) heterogeneous polymer sample tapping-mode imaging |
| url | https://doi.org/10.3762/bjnano.8.158 |
| work_keys_str_mv | AT juanren highspeeddynamicmodeatomicforcemicroscopyimagingofpolymersanadaptivemultiloopmodeapproach AT qingzezou highspeeddynamicmodeatomicforcemicroscopyimagingofpolymersanadaptivemultiloopmodeapproach |