Multiple-interface tracking of degradation process in organic photovoltaics
The investigation of the stability in organic photovoltaics has been focused on individual components via localized and destructive analysis, which is limited to broken devices, instead of an operational OPV, and unable to obtain correlated information of degrading interfaces. DC biased AC impedance...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2013-10-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.4826586 |
| _version_ | 1819106561818099712 |
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| author | Cindy X. Zhao Lucy L. Deng Matthew Y. Ma Joseph R. Kish Gu Xu |
| author_facet | Cindy X. Zhao Lucy L. Deng Matthew Y. Ma Joseph R. Kish Gu Xu |
| author_sort | Cindy X. Zhao |
| collection | DOAJ |
| description | The investigation of the stability in organic photovoltaics has been focused on individual components via localized and destructive analysis, which is limited to broken devices, instead of an operational OPV, and unable to obtain correlated information of degrading interfaces. DC biased AC impedance spectroscopy is employed here, to track multi-interface degradation without breaking the device. By varying DC bias, individual interface degradation is revealed via current density and capacitance versus voltage plots. While one of the impedance semicircles is linked to the interface of P3HT:PCBM, the other represented the interface between the mixture and metal electrode, involving metal oxide in an aged device. The results confirm that, more than one degradation process take place simultaneously at individual interfaces. |
| first_indexed | 2024-12-22T02:40:06Z |
| format | Article |
| id | doaj.art-6e517c6b40424a15901caf2de87ba20f |
| institution | Directory Open Access Journal |
| issn | 2158-3226 |
| language | English |
| last_indexed | 2024-12-22T02:40:06Z |
| publishDate | 2013-10-01 |
| publisher | AIP Publishing LLC |
| record_format | Article |
| series | AIP Advances |
| spelling | doaj.art-6e517c6b40424a15901caf2de87ba20f2022-12-21T18:41:39ZengAIP Publishing LLCAIP Advances2158-32262013-10-01310102121102121-710.1063/1.4826586024310ADVMultiple-interface tracking of degradation process in organic photovoltaicsCindy X. Zhao0Lucy L. Deng1Matthew Y. Ma2Joseph R. Kish3Gu Xu4Materials Science and Engineering, McMaster University, Hamilton, Ontario, L8S4L7, CanadaMaterials Science and Engineering, McMaster University, Hamilton, Ontario, L8S4L7, CanadaMaterials Science and Engineering, McMaster University, Hamilton, Ontario, L8S4L7, CanadaMaterials Science and Engineering, McMaster University, Hamilton, Ontario, L8S4L7, CanadaMaterials Science and Engineering, McMaster University, Hamilton, Ontario, L8S4L7, CanadaThe investigation of the stability in organic photovoltaics has been focused on individual components via localized and destructive analysis, which is limited to broken devices, instead of an operational OPV, and unable to obtain correlated information of degrading interfaces. DC biased AC impedance spectroscopy is employed here, to track multi-interface degradation without breaking the device. By varying DC bias, individual interface degradation is revealed via current density and capacitance versus voltage plots. While one of the impedance semicircles is linked to the interface of P3HT:PCBM, the other represented the interface between the mixture and metal electrode, involving metal oxide in an aged device. The results confirm that, more than one degradation process take place simultaneously at individual interfaces.http://dx.doi.org/10.1063/1.4826586 |
| spellingShingle | Cindy X. Zhao Lucy L. Deng Matthew Y. Ma Joseph R. Kish Gu Xu Multiple-interface tracking of degradation process in organic photovoltaics AIP Advances |
| title | Multiple-interface tracking of degradation process in organic photovoltaics |
| title_full | Multiple-interface tracking of degradation process in organic photovoltaics |
| title_fullStr | Multiple-interface tracking of degradation process in organic photovoltaics |
| title_full_unstemmed | Multiple-interface tracking of degradation process in organic photovoltaics |
| title_short | Multiple-interface tracking of degradation process in organic photovoltaics |
| title_sort | multiple interface tracking of degradation process in organic photovoltaics |
| url | http://dx.doi.org/10.1063/1.4826586 |
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