Multiple-interface tracking of degradation process in organic photovoltaics

Multiple-interface tracking of degradation process in organic photovoltaics

The investigation of the stability in organic photovoltaics has been focused on individual components via localized and destructive analysis, which is limited to broken devices, instead of an operational OPV, and unable to obtain correlated information of degrading interfaces. DC biased AC impedance...

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Bibliographic Details
Main Authors: Cindy X. Zhao, Lucy L. Deng, Matthew Y. Ma, Joseph R. Kish, Gu Xu
Format: Article
Language:English
Published: AIP Publishing LLC 2013-10-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.4826586

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