Ingress of Threshold Voltage-Triggered Hardware Trojan in the Modern FPGA Fabric–Detection Methodology and Mitigation

Ingress of Threshold Voltage-Triggered Hardware Trojan in the Modern FPGA Fabric–Detection Methodology and Mitigation

The ageing phenomenon of negative bias temperature instability (NBTI) continues to challenge the dynamic thermal management of modern FPGAs. Increased transistor density leads to thermal accumulation and propagates higher and non-uniform temperature variations across the FPGA. This aggravates the im...

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Bibliographic Details
Main Authors: Sohaib Aslam, Ian K. Jennions, Mohammad Samie, Suresh Perinpanayagam, Yisen Fang
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Access
Subjects:
Ageing mechanism
field programmable gate array (FPGA)
hardware Trojan
negative bias temperature instability (NBTI)
propagation delay
reliability
Online Access:https://ieeexplore.ieee.org/document/8993719/

Internet

https://ieeexplore.ieee.org/document/8993719/

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